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Electrical and Structural Characterization of GaN p-n Heterostuctures by Scanning Probe Microscopy

Published online by Cambridge University Press:  01 August 2002

M. I. N. da Silva ,
J. C. González  and
P. E. Russell
M. I. N. da Silva
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, North Carolina 27695-7531, USA
J. C. González
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, North Carolina 27695-7531, USA
P. E. Russell
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, North Carolina 27695-7531, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1206 - 1207
Copyright
Copyright © Microscopy Society of America 2002