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Relative uncertainties in mass attenuation coefficients and their influence on quantitative EDS and WDS analysis

Published online by Cambridge University Press:  04 August 2017

Ralf Terborg ,
Jan Dellith ,
Andy Scheffel  and
Michael Abratis
Ralf Terborg
Affiliation:
Bruker Nano GmbH, Am Studio 2D, DE-12489 Berlin, Germany
Jan Dellith
Affiliation:
Leibniz Institute of Photonic Technology, Albert-Einstein-Strasse 9, DE-07745 Jena, Germany
Andy Scheffel
Affiliation:
Leibniz Institute of Photonic Technology, Albert-Einstein-Strasse 9, DE-07745 Jena, Germany
Michael Abratis
Affiliation:
Bruker Nano GmbH, Am Studio 2D, DE-12489 Berlin, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 500 - 501
Copyright
© Microscopy Society of America 2017 

References

[1] Henke, B L, et al, Atom. Data Nucl. Data Tables 27 1982). p 1.Google Scholar
[2] Henke, B L, et al, Atom. Data Nucl. Data Tables 54 1993). p. 181.Google Scholar
[3] Heinrich, K F J Proc 11th Int Congr. on X-Ray Optics and Microanalysis 1986). p. 67.Google Scholar
[4] Pouchou, J L & Pichoir, F Electron Probe Quantitation (Eds, Heinrich & Newbury: Plenum Press N.Y. 1991 31.CrossRefGoogle Scholar
[5] Llovet, , et al, IOP Conf. Series: Materials Science and Engineering 32 2012 012014.Google Scholar
[6] Kyser, D F Proc 6th Int Congr on X-Ray Optics and Microanalysis. Tokyo Univ Press 1972 147.Google Scholar