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Application of SIMS-SSAMS to Characterization of Surrogate Pre- and Post-Detonation Urban Debris Standard Reference Materials.

Published online by Cambridge University Press:  04 August 2017

Evan E. Groopman ,
Kenneth S. Grabowski  and
Albert J. Fahey
Evan E. Groopman
Affiliation:
Materials Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA
Kenneth S. Grabowski
Affiliation:
Materials Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA
Albert J. Fahey
Affiliation:
Microscopy & Surface Analysis, Corning Incorporated, Corning, NY, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 504 - 505
Copyright
© Microscopy Society of America 2017 

References

[1] Mann, JL, et al Methods and Applications of Radioanalytical Chemistry X (2015), Abs. #331.Google Scholar
[2] Fahey, A, et al, Analytical Chemistry 88 2016). p. 7145.CrossRefGoogle Scholar
[3] Fahey, AJ International Journal of Mass Spectrometry 176 1998). p. 63.Google Scholar
[4] Groopman, EE, et al Lunar and Planetary Science XLVIII (2017), Abs. #1551.Google Scholar
[5] Anders, E & Grevesse, N Geochimica et Cosmochimica Acta 53 1989). p. 197.Google Scholar
[6] The authors acknowledge the Office of Naval Research for funding and support, and Jackie Mann.Google Scholar