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Collection Efficiency of the Twin EDS Detectors for Quantitative X-ray Analysis on A New Probe-Corrected TEM/STEM

Published online by Cambridge University Press:  04 August 2017

Jane Y. Howe ,
Tarunika Ramprasad ,
Akinari Hanawa ,
Hiromi Inada ,
Jose Jimenez ,
David Hoyle ,
Edgar Voelkl  and
Thomas J. Zega
Jane Y. Howe
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.
Tarunika Ramprasad
Affiliation:
Department of Materials Science and Engineering, University of Arizona, USA.
Akinari Hanawa
Affiliation:
Hitachi High Technologies Co., Hitachinaka, Japan.
Hiromi Inada
Affiliation:
Hitachi High Technologies Co., Hitachinaka, Japan.
Jose Jimenez
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.
David Hoyle
Affiliation:
Hitachi High Technologies Canada Inc., Toronto, Canada.
Edgar Voelkl
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.
Thomas J. Zega
Affiliation:
Department of Materials Science and Engineering, University of Arizona, USA. Lunar and Planetary Laboratory, University of Arizona, USA.

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 520 - 521
Copyright
© Microscopy Society of America 2017 

References

[1] Zaluzec, NJ Microsc Microanal 2013 19(S2), 1262.Google Scholar
[2] Zaluzec, NJ Microsc Microanal 2014 20, 1318.Google Scholar
[3] Zaluzec, NJ, DesOrmeaux, JP & Roussie, J Microsc Microanal 2016 22(S3), 322.Google Scholar
[4] Research supported by NSF grant number 1531243 and NASA grant numbers NNX15AJ22G and NNX12AL47G. The work was carried out at the Kuiper Core Imaging and Microscopy Facility, University of Arizona. We thank Dr. Nestor Zaluzec for the insightful discussions..Google Scholar