Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 36 of 44

Quantitative X-ray Microanalysis

Research Article

Electron Probe Microanalysis of C-N Films using the NIST FFAST Mass Absorption Coefficients
R Marinenko, N Ritchie, D Newbury, J Small
Published online by Cambridge University Press:

05 August 2007, pp. 1402-1403
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Energies and Relative Intensities of L and M lines in the Low-energy Range
R Terborg
Published online by Cambridge University Press:

05 August 2007, pp. 1404-1405
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Efficient Discrimination of Bonded Si and O in Wavelength-dispersive X-ray Microanalysis
G Brown, E Lochner, D O'Hara
Published online by Cambridge University Press:

05 August 2007, pp. 1406-1407
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

FIB/DualBeam Techniques for Quantitative Analyses
L Giannuzzi
Published online by Cambridge University Press:

05 August 2007, pp. 1408-1409
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Electron-Probe Microanalysis of Geological Materials: Calibration Standards and Instrumental Performance
P Carpenter, J Donovan
Published online by Cambridge University Press:

05 August 2007, pp. 1410-1411
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Application of Quantitative X-Ray Microanalysis in Response to Extreme Events
G Meeker
Published online by Cambridge University Press:

05 August 2007, pp. 1412-1413
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Uncovering the History of Monazite from the Menderes Massif, Western Turkey Using the Electron and Ion Microprobes
C Baker, E Catlos, I Cemen, M Kohn
Published online by Cambridge University Press:

05 August 2007, pp. 1414-1415
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Characterization of AlMg Alloys from their Electronic Structure
K Le Guen, J-M André, R Gauvin, P Jonnard
Published online by Cambridge University Press:

05 August 2007, pp. 1416-1417
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Quantitative X-ray Microanalysis Of Submicron Carbide Formation in Chromium (III) Oxide Rich Scale
K Collins, M Ziomek-Moroz, G Holcomb, P Danielson, A Hunt
Published online by Cambridge University Press:

05 August 2007, pp. 1418-1419
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

SEM and XEDS Fingerprinting of the Second World War Era Medals to Identify Counterfeits
A Aneja, D Maerz, JF Mansfield
Published online by Cambridge University Press:

05 August 2007, pp. 1420-1421
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Characterization and Restoration of 19th Century Daguerreotypes by SEM, XEDS,and FIB
EA Gregory, CS DeRoo, JF Mansfield
Published online by Cambridge University Press:

05 August 2007, pp. 1422-1423
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Combination of Energy Dispersive Electron Probe Microanalysis with X-ray Fluorescence Analysis in a SEM
M Procop, V-D Hodoroaba
Published online by Cambridge University Press:

05 August 2007, pp. 1424-1425
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Applications and Future Prospects for X-ray Fluorescence Microprobe Analysis
B Lai, S Vogt, J Maser, B Ravel, K Kemner, M Daly
Published online by Cambridge University Press:

05 August 2007, pp. 1426-1427
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Digital Pulse Processing and Pile Up Correction for Accurate Interpretation of High Rate SDD Spectrum Images
P Statham
Published online by Cambridge University Press:

05 August 2007, pp. 1428-1429
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Optimum Performance for Microanalysis with Silicon Drift Detectors with Integrated FET
A Niculae, H Soltau, P Lechner, A Liebl, G Lutz, L Strüder, R Eckhard, G Schaller, F Schopper
Published online by Cambridge University Press:

05 August 2007, pp. 1430-1431
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Standardless Quantitative Analysis Using a Drift Detector, What Accuracy is Possible from Live and Reconstructed Data?
S Burgess, P Statham, J Holland, Y-H Chou
Published online by Cambridge University Press:

05 August 2007, pp. 1432-1433
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Improved EDS Pileup Rejection at Low Energies and High Count Rates
RB Mott
Published online by Cambridge University Press:

05 August 2007, pp. 1434-1435
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Reevaluating Acquisition Parameters for Elemental Quantification with EDS
P Camus, D Rohde, D McMillan
Published online by Cambridge University Press:

05 August 2007, pp. 1436-1437
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

X-ray Analysis of Nano-structures Using the INCAPentaFET-x3 Si(Li) detector
S Burgess, J Holland, N Rowlands
Published online by Cambridge University Press:

05 August 2007, pp. 1438-1439
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Effect of the Specimen Charging on the Accuracy of X-ray Analysis in the Variable Pressure SEM
SJ Bean, VM Kugler
Published online by Cambridge University Press:

05 August 2007, pp. 1440-1441
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 36 of 44

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Quantitative X-ray Microanalysis

Research Article

Electron Probe Microanalysis of C-N Films using the NIST FFAST Mass Absorption Coefficients

The Energies and Relative Intensities of L and M lines in the Low-energy Range

Efficient Discrimination of Bonded Si and O in Wavelength-dispersive X-ray Microanalysis

FIB/DualBeam Techniques for Quantitative Analyses

Electron-Probe Microanalysis of Geological Materials: Calibration Standards and Instrumental Performance

Application of Quantitative X-Ray Microanalysis in Response to Extreme Events

Uncovering the History of Monazite from the Menderes Massif, Western Turkey Using the Electron and Ion Microprobes

Characterization of AlMg Alloys from their Electronic Structure

Quantitative X-ray Microanalysis Of Submicron Carbide Formation in Chromium (III) Oxide Rich Scale

SEM and XEDS Fingerprinting of the Second World War Era Medals to Identify Counterfeits

Characterization and Restoration of 19th Century Daguerreotypes by SEM, XEDS,and FIB

Combination of Energy Dispersive Electron Probe Microanalysis with X-ray Fluorescence Analysis in a SEM

Applications and Future Prospects for X-ray Fluorescence Microprobe Analysis

Digital Pulse Processing and Pile Up Correction for Accurate Interpretation of High Rate SDD Spectrum Images

Optimum Performance for Microanalysis with Silicon Drift Detectors with Integrated FET

Standardless Quantitative Analysis Using a Drift Detector, What Accuracy is Possible from Live and Reconstructed Data?

Improved EDS Pileup Rejection at Low Energies and High Count Rates

Reevaluating Acquisition Parameters for Elemental Quantification with EDS

X-ray Analysis of Nano-structures Using the INCAPentaFET-x3 Si(Li) detector

The Effect of the Specimen Charging on the Accuracy of X-ray Analysis in the Variable Pressure SEM

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Quantitative X-ray Microanalysis

Research Article