Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 38 of 44

Variable Pressure Electron Microscopy and Electron Beam Assisted Deposition

Research Article

Cascade Amplification Characteristics of Off-Axis Anode/SE Detector Configurations in Low Vacuum SEM
BL Thiel, V Tileli
Published online by Cambridge University Press:

05 August 2007, pp. 1482-1483
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Noise Considerations in Low Vacuum Scanning Electron Microscopy
V Tileli, M Toth, R Knowles, BL Thiel
Published online by Cambridge University Press:

05 August 2007, pp. 1484-1485
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Improvements to a Gaseous Scintillation Detector for a Variable Pressure Scanning Electron Microscope
OE Evans, JP Craven
Published online by Cambridge University Press:

05 August 2007, pp. 1486-1487
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Vacuum Solutions Designed for the SEM / TEM Microscopes
R Cerruti
Published online by Cambridge University Press:

05 August 2007, pp. 1488-1489
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

In-Situ Tensile Testing of Hair Fibers in An Environmental Scanning Electron Microscope (ESEM)
S Diridollou, P Hallégot, P Mainwaring, F Leroy, VH Barbosa, NJ Zaluzec
Published online by Cambridge University Press:

05 August 2007, pp. 1490-1491
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Applications of Variable Pressure SEM and Raman Spectroscopy for the Non-destructive Study of Bio-Specimens from Pre-Columbian Mummies in the Tarapacá Valley, Northern Chile
S Prikhodko, C Fischer, R Boytner, M Lozada, M Uribe, I Kakoulli
Published online by Cambridge University Press:

05 August 2007, pp. 1492-1493
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Examination of Fouling and Plugging Mechanisms of Porous Polymer Membranes by SEM
D Bell, C Bondy, C Santeufemio
Published online by Cambridge University Press:

05 August 2007, pp. 1494-1495
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

FIB Instrumentation and Application Advances for Physical and Biological Sciences

Research Article

Nanolithography of Electrically Insulating Materials Using Simultaneous Defocused Primary Electron Beam and Focused Ion Beam Irradiation
D Stokes, T Vystavel, O Wilhelmi
Published online by Cambridge University Press:

05 August 2007, pp. 1496-1497
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Focused Ion Beam in Thermal Science and Engineering
T Choi, B Kang, D Poulikakos
Published online by Cambridge University Press:

05 August 2007, pp. 1498-1499
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

I-V Characterization of FIB Damaged GaN Alloy LEDs
C Progl, C Parish, P Russell
Published online by Cambridge University Press:

05 August 2007, pp. 1500-1501
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Ion Beam Irradiation Damage on poly(3-hexylthiophene) (P3HT) Based Organic Optoelectronic Devices: Can Cryo-FIB Help?
S Meltem, N Philipp M., M Stephan, C Boril, F Evelin, P Peter, T Elena, G Werner, P Harald, L Emil J.W.
Published online by Cambridge University Press:

05 August 2007, pp. 1502-1503
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

FIB Characterization of the Cathode Microstructure in a Single Solid Oxide Fuel Cell (SOFC)
A Chen, J Bourne, K Siebein, J Smith, R DeHoff, E Wachsman, K Jones
Published online by Cambridge University Press:

05 August 2007, pp. 1504-1505
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Static vs. Dynamic FIB/SEM Methods For 3D Modeling
B Van Leer, L Giannuzzi
Published online by Cambridge University Press:

05 August 2007, pp. 1506-1507
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

3D-Orientation Microscopy in a FIB SEM: A New Dimension of Microstructure Characterization
S Zaefferer, S Wright, D Raabe
Published online by Cambridge University Press:

05 August 2007, pp. 1508-1509
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

FIB-Tomography of Nanoindentation Cracks in Zirconia Polycrystals
FA Soldera, Y Gaillard, M Anglada Gomila, F Muecklich
Published online by Cambridge University Press:

05 August 2007, pp. 1510-1511
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Focused Ion Beam Fabrication of Nanopores in Metal and Dielectric Membranes
D Adams, M Vasile, C Hodges, N Patterson
Published online by Cambridge University Press:

05 August 2007, pp. 1512-1513
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Fabrication of Three-Dimensional Devices with Various Nano Components Using a Combination of a FIB System and Nano Manipulation
J Jeon, J Lee, DK Cha, TH Lee, J Wang, MJ Kim
Published online by Cambridge University Press:

05 August 2007, pp. 1514-1515
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Evidence for a Critical Amorphization Thickness Limit of Ga+ Ion Bombardment in Si
L Giannuzzi, B Van Leer, J Ringnalda
Published online by Cambridge University Press:

05 August 2007, pp. 1516-1517
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

New Methods for Cross-Section Sample Preparation Using Broad Argon Ion Beam
K Ogura, M Kamidaira, S Asahina, N Erdman
Published online by Cambridge University Press:

05 August 2007, pp. 1518-1519
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Post-FIB TEM Sample Preparation Using A Low Energy Argon Beam
A Genç, The Ohio State University, E A Fischione Instruments Inc, The Ohio State University
Published online by Cambridge University Press:

05 August 2007, pp. 1520-1521
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 38 of 44

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Variable Pressure Electron Microscopy and Electron Beam Assisted Deposition

Research Article

Cascade Amplification Characteristics of Off-Axis Anode/SE Detector Configurations in Low Vacuum SEM

Noise Considerations in Low Vacuum Scanning Electron Microscopy

Improvements to a Gaseous Scintillation Detector for a Variable Pressure Scanning Electron Microscope

Vacuum Solutions Designed for the SEM / TEM Microscopes

In-Situ Tensile Testing of Hair Fibers in An Environmental Scanning Electron Microscope (ESEM)

Applications of Variable Pressure SEM and Raman Spectroscopy for the Non-destructive Study of Bio-Specimens from Pre-Columbian Mummies in the Tarapacá Valley, Northern Chile

Examination of Fouling and Plugging Mechanisms of Porous Polymer Membranes by SEM

FIB Instrumentation and Application Advances for Physical and Biological Sciences

Research Article

Nanolithography of Electrically Insulating Materials Using Simultaneous Defocused Primary Electron Beam and Focused Ion Beam Irradiation

Focused Ion Beam in Thermal Science and Engineering

I-V Characterization of FIB Damaged GaN Alloy LEDs

Ion Beam Irradiation Damage on poly(3-hexylthiophene) (P3HT) Based Organic Optoelectronic Devices: Can Cryo-FIB Help?

FIB Characterization of the Cathode Microstructure in a Single Solid Oxide Fuel Cell (SOFC)

Static vs. Dynamic FIB/SEM Methods For 3D Modeling

3D-Orientation Microscopy in a FIB SEM: A New Dimension of Microstructure Characterization

FIB-Tomography of Nanoindentation Cracks in Zirconia Polycrystals

Focused Ion Beam Fabrication of Nanopores in Metal and Dielectric Membranes

Fabrication of Three-Dimensional Devices with Various Nano Components Using a Combination of a FIB System and Nano Manipulation

Evidence for a Critical Amorphization Thickness Limit of Ga+ Ion Bombardment in Si

New Methods for Cross-Section Sample Preparation Using Broad Argon Ion Beam

Post-FIB TEM Sample Preparation Using A Low Energy Argon Beam

Microscopy and Microanalysis

Refine listing

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Volume 13 - Issue S02 - August 2007

Variable Pressure Electron Microscopy and Electron Beam Assisted Deposition

Research Article

FIB Instrumentation and Application Advances for Physical and Biological Sciences

Research Article