Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 35 of 44

Spectral Imaging and Data Analysis: Where are We Now and Where are We Going?

Research Article

Attaining High Count Rates and X-Ray Mapping for the SDD
R Anderhalt, D Redfern, A Sandborg
Published online by Cambridge University Press:

05 August 2007, pp. 1362-1363
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Schemes for Maximizing X-ray Detection in an SEM
D Rohde, P Camus
Published online by Cambridge University Press:

05 August 2007, pp. 1364-1365
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Cryo-Valence EELS Observation of The Compositional Distribution in Biphasic Polymer Nanocolloids Preserved in Vitrified Ice
G Kim, D Meyers
Published online by Cambridge University Press:

05 August 2007, pp. 1366-1367
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Multivariate Statistical Analysis of Compositional Data within the Simplex
JH Scott
Published online by Cambridge University Press:

05 August 2007, pp. 1368-1369
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Fast X-ray Mapping with Excellent Light Element Performance from an SDD
D Redfern, B Anderhalt, A Sandborg
Published online by Cambridge University Press:

05 August 2007, pp. 1370-1371
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Multivariate Statistical Analysis
P Kotula, J Michael, D Newbury
Published online by Cambridge University Press:

05 August 2007, pp. 1372-1373
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Hyperspectral Analysis of Portland Cement Concrete Using the Silicon Drift Detector
J Davis, P Rangaraju, D Newbury
Published online by Cambridge University Press:

05 August 2007, pp. 1374-1375
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Biological Electron Probe Microanalysis - Spectrum Imaging using Programmed Beam Acquisition
P Ingram, S Davilla, A LeFurgey
Published online by Cambridge University Press:

05 August 2007, pp. 1376-1377
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Cathodoluminescence of Defects, Interstitial Molecules, and Clusters in Silica
H-J Fitting, R Salh, L Fitting Kourkoutis
Published online by Cambridge University Press:

05 August 2007, pp. 1378-1379
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Determining Spatial Resolution in Raman Spectral Imaging – What is Different from Optical Microscopy Imaging
E Lee, A Whitely
Published online by Cambridge University Press:

05 August 2007, pp. 1380-1381
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

IR Microspectroscopic Analysis of Localized Chemical Changes in Aorta and Retina Tissue Resulting from Stimuli
D Wetzel
Published online by Cambridge University Press:

05 August 2007, pp. 1382-1383
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Quantitative X-ray Microanalysis

Research Article

The Effect of Auger Electrons on X-Ray Microanalysis in Electron Microscopy
R Gauvin
Published online by Cambridge University Press:

05 August 2007, pp. 1384-1385
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Review of Recent Measurements and Calculations of Inner-shell Ionization Cross Sections for EPMA
X Llovet, C Merlet, F Salvat
Published online by Cambridge University Press:

05 August 2007, pp. 1386-1387
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Simulation of EPMA Spectra Using PENELOPE
F Salvat, JA Escuder, D Bote, X Llovet
Published online by Cambridge University Press:

05 August 2007, pp. 1388-1389
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Problem of Secondary Fluorescence in EPMA in the Application of the Ti-in-Zircon Geothermometer and the Utility of PENEPMA Monte Carlo Program
J Fournelle
Published online by Cambridge University Press:

05 August 2007, pp. 1390-1391
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

A General X-ray Fluorescence Correction for Electron Microanalysis by Monte Carlo Simulations
H Demers, R Gauvin
Published online by Cambridge University Press:

05 August 2007, pp. 1392-1393
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Application of Luminescent Atlas to Analysing Cathodoluminescence Spectra
C MacRae, N Wilson, A Torpy
Published online by Cambridge University Press:

05 August 2007, pp. 1394-1395
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Comparison of K-ratios from Monte Carlo Codes and Experimental Data and Evaluation of the Effect of X-Ray Fluorescence Emission on the K-ratios
P T.-Pinard, H Demers, P Hovington, R Gauvin
Published online by Cambridge University Press:

05 August 2007, pp. 1396-1397
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Microanalysis with a Low Energy Helium Ion Beam
D Joy, BJ Griffin
Published online by Cambridge University Press:

05 August 2007, pp. 1398-1399
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Sensitivity of Moire Fringes in SEM Images to Instrumental and Environmental Artifacts
BJ Griffin, D Joy
Published online by Cambridge University Press:

05 August 2007, pp. 1400-1401
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 35 of 44

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Spectral Imaging and Data Analysis: Where are We Now and Where are We Going?

Research Article

Attaining High Count Rates and X-Ray Mapping for the SDD

Schemes for Maximizing X-ray Detection in an SEM

Cryo-Valence EELS Observation of The Compositional Distribution in Biphasic Polymer Nanocolloids Preserved in Vitrified Ice

Multivariate Statistical Analysis of Compositional Data within the Simplex

Fast X-ray Mapping with Excellent Light Element Performance from an SDD

Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Multivariate Statistical Analysis

Hyperspectral Analysis of Portland Cement Concrete Using the Silicon Drift Detector

Biological Electron Probe Microanalysis - Spectrum Imaging using Programmed Beam Acquisition

Cathodoluminescence of Defects, Interstitial Molecules, and Clusters in Silica

Determining Spatial Resolution in Raman Spectral Imaging – What is Different from Optical Microscopy Imaging

IR Microspectroscopic Analysis of Localized Chemical Changes in Aorta and Retina Tissue Resulting from Stimuli

Quantitative X-ray Microanalysis

Research Article

The Effect of Auger Electrons on X-Ray Microanalysis in Electron Microscopy

Review of Recent Measurements and Calculations of Inner-shell Ionization Cross Sections for EPMA

Simulation of EPMA Spectra Using PENELOPE

The Problem of Secondary Fluorescence in EPMA in the Application of the Ti-in-Zircon Geothermometer and the Utility of PENEPMA Monte Carlo Program

A General X-ray Fluorescence Correction for Electron Microanalysis by Monte Carlo Simulations

Application of Luminescent Atlas to Analysing Cathodoluminescence Spectra

Comparison of K-ratios from Monte Carlo Codes and Experimental Data and Evaluation of the Effect of X-Ray Fluorescence Emission on the K-ratios

Microanalysis with a Low Energy Helium Ion Beam

The Sensitivity of Moire Fringes in SEM Images to Instrumental and Environmental Artifacts

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Spectral Imaging and Data Analysis: Where are We Now and Where are We Going?

Research Article

Quantitative X-ray Microanalysis

Research Article