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Optimum Performance for Microanalysis with Silicon Drift Detectors with Integrated FET

Published online by Cambridge University Press:  05 August 2007

A Niculae ,
H Soltau ,
P Lechner ,
A Liebl ,
G Lutz ,
L Strüder ,
R Eckhard ,
G Schaller  and
F Schopper
A Niculae
Affiliation:
PNSensor,Germany
H Soltau
Affiliation:
PNSensor,Germany
P Lechner
Affiliation:
PNSensor,Germany
A Liebl
Affiliation:
PNSensor,Germany
G Lutz
Affiliation:
PNSensor,Germany
L Strüder
Affiliation:
MPI Semiconductor Laboratory,Germany
R Eckhard
Affiliation:
PNSensor,Germany
G Schaller
Affiliation:
MPI Semiconductor Laboratory,Germany
F Schopper
Affiliation:
MPI Semiconductor Laboratory,Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1430 - 1431
Copyright
© 2007 Microscopy Society of America

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