Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Maniguet, L
Robaut, F
Meuris, A
Roussel-Dherbey, F
and
Chariot, F
2012.
X-ray microanalysis: the state of the art of SDD detectors and WDS systems on scanning electron microscopes (SEM).
IOP Conference Series: Materials Science and Engineering,
Vol. 32,
Issue. ,
p.
012015.
Morita, Hirobumi
Marks, Sam
and
Anderson, Iain
2019.
The Recent Resolution and Detection Limit Improvement of EDS and EBSD with SEM: Invited Paper.
p.
51.