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The Effect of the Specimen Charging on the Accuracy of X-ray Analysis in the Variable Pressure SEM

Published online by Cambridge University Press:  05 August 2007

SJ Bean  and
VM Kugler
SJ Bean
Affiliation:
Carl Zeiss,UK
VM Kugler
Affiliation:
Carl Zeiss,UK
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1440 - 1441
Copyright
© 2007 Microscopy Society of America

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