Microscopy and Microanalysis: Volume 27 - Issue S1

Only show content I have access to (1140)

Over 3 years (1141)

Physical Sciences Symposia (574)

Biological Sciences Symposia (212)

Author Index (1)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Defects in Materials: How We See and Understand Them

Show me your “Hand”: Direct determination of “handedness” in NaCu5S3 chiral crystal via aberration-corrected scanning transmission electron microscopy

Atomic-scale deciphering the defect-related structure and doping behavior of transition metal in SnO2 nanoparticles

Structural defects in ZnO thin films grown by atomic layer deposition at low temperatures

Cepstral Scanning Transmission Electron Microscopy Imaging of Disordered Crystals using Coherent Diffuse Scattering

Advanced Characterization of Components Fabricated by Additive Manufacturing

Microstructural characterization of 316L stainless steel fabricated by selective laser melting by advanced electron microscopy techniques

HR-EBSD based Characterization of Dislocations in Additive Manufactured 316L Stainless Steel

Characterizing the influence of parent grain structures on the physical properties of additively manufactured Ti-64 alloys using EBSD

Understanding the effect of cellular structures on mechanical behavior of additively manufactured 316L stainless steel

The effect of beam scan strategies on the microstructure and mechanical properties of additive manufacturing Ti-6Al-4V builds

Segregation and Precipitation at Cell Boundaries in Rapidly Solidified Austenitic Stainless Steels.

Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM

Live Mapping of Crystalline Regions During in-situ Heating (TEM and STEM)

Early stages of phase decomposition in NiAu alloy thin films studied by in situ TEM using ultrafast quenching methods

In situ chip-based heating studies of metal-induced layer exchange and Si crystallization using STEM, LEND and SE imaging in SEM

Electron Beam as a Probe and Stimulus: Challenges and Opportunities

Few-second EELS mapping with atomic-resolution

Fast and Ultrafast Dynamics Using Electron Microscopy

Expanding the capabilities of the RF stroboscopic TEM

Development of High-Speed Scan System for Atomic Resolution STEM

High-Resolution Transmission Electron Microscopy with Bright Microsecond Electron Pulses

Photoinduced Topological Insulator to Dirac Semimetal Transition in ZrTe5

Microscopy & Spectroscopy of Energy Conversion and Storage Materials

In Situ TEM Nano Electrochemistry

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Defects in Materials: How We See and Understand Them

Advanced Characterization of Components Fabricated by Additive Manufacturing

Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM

Fast and Ultrafast Dynamics Using Electron Microscopy

Microscopy & Spectroscopy of Energy Conversion and Storage Materials