Microscopy and Microanalysis: Volume 27 - Issue S1

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis

Atomic Structure of Superconducting Tunnel Junctions using STEM and APT

Directions in Atom Probe Tomography

The Effect of Analysis Conditions on the Fidelity of Atom Probe Data of Zirconium Alloys

Optimal Specimen Preparation for Correlative Atom Probe Tomography and Electron Microscopy of Environmentally Sensitive Materials

Matrix Composition and Fine-scale Structure Analysis of NMC Li-ion Battery Using Atom Probe Tomography

Stoichiometric analysis of superficial Ba doped Strontium Titanium Oxide layers using APT: the case of the missing Oxygen!

Electrostatic Reconstruction Technology in Atom Probe Tomography

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

A Ptychographic Approach for Low Dose Electron Imaging of Organic Molecules

Low Dose 4D Scanning Transmission Electron Microscopy of Block Copolymers and Homopolymers at 30 keV in an SEM

Autonomous EBSD Pattern Classification Performance with Changing Acquisition Parameters

Reconstructing grains in 3D through 4D Scanning Precession Electron Diffraction

Analysis of Dynamical Electron Backscatter Diffraction Patterns of Ferrite and Martensite Phases in Steels

Microscopy and Microanalysis for Real World Problem Solving

Engineering the Micro-texture of Zn Coating by Carbon Nanotube Incorporation for Enhanced Corrosion Resistance Behavior.

Simulating Electrochemical Performance of Solid-State Electrolyte Bilayers Characterized by FIB Tomography

Making electrodes by particle stamping for microscopic and electrochemical analysis

Transfer of lithium foil under inert conditions using CleanConnect inert gas transfer system

SEM-EDS coating thickness assessment: an insight into the accuracy of Monte Carlo simulations carried out for TiN coatings using three different freeware graphical user interface

Correlating Microscopy Techniques for Understanding Root Cause of Defects in Coatings

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy

Deep Learning-Based Point-Scanning Super-Resolution Microscopy

Benchmark tests of atom-locating CNN models with a consistent dataset

Microscopy and Microanalysis

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Volume 27 - Supplement S1 - August 2021

Physical Sciences Symposia

Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Microscopy and Microanalysis for Real World Problem Solving

Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy