Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-26T13:22:13.763Z Has data issue: false hasContentIssue false
  • English
  • Français

Expanding the capabilities of the RF stroboscopic TEM

Published online by Cambridge University Press:  30 July 2021

June Lau ,
Kayla Callaway ,
Hsin-Yun Chao ,
John Cumings ,
Hyeokmin Choe ,
Eric Montgomery ,
Chunguang Jing  and
Yimei Zhu
June Lau
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland, United States
Kayla Callaway
Affiliation:
Department of Materials Science and Engineering, University of Maryland, College Park, Maryland, United States
Hsin-Yun Chao
Affiliation:
Department of Materials Science and Engineering, University of Maryland, College Park, United States
John Cumings
Affiliation:
Department of Materials Science and Engineering, University of Maryland, College Park, United States
Hyeokmin Choe
Affiliation:
Euclid Techlabs, United States
Eric Montgomery
Affiliation:
Euclid Techlabs, United States
Chunguang Jing
Affiliation:
Euclid Techlabs, United States
Yimei Zhu
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Fast and Ultrafast Dynamics Using Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2708
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Jing, C, et al. , Ultramicroscopy, 207 (2019) 112829. DOI: 10.1016/j.ultramic.2019.112829Google Scholar
Lau, J W, et al. , Rev. Sci. Instr. 91 (2020) 021301. DOI:10.1063/1.5131758CrossRefGoogle Scholar
2019 R&D100 Award for “Affordable Laser-free Retrofittable Stroboscopic Solution for Ultra-fast Electron Microscopy“ (R&D 100 Magazine)Google Scholar
2020 Microscopy Innovation Award (Microscopy Today)Google Scholar
Fu, X, et al. , Science Advances, 6 (2020) eabc3456. DOI: 10.1126/sciadv.abc3456CrossRefGoogle Scholar