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Development of High-Speed Scan System for Atomic Resolution STEM

Published online by Cambridge University Press:  30 July 2021

Yu Jimbo ,
Ryo Ishikawa ,
Mitsuhisa Terao ,
Masashi Nishikawa ,
Shigeyuki Morishita ,
Masaki Mukai ,
Hidetaka Sawada ,
Yuichi Ikuhara  and
Naoya Shibata
Yu Jimbo
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
Mitsuhisa Terao
Affiliation:
JEOL Ltd., Akishima, Japan
Masashi Nishikawa
Affiliation:
JEOL Ltd., Akishima, Japan
Shigeyuki Morishita
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Masaki Mukai
Affiliation:
JEOL Ltd., Akishima, Japan
Hidetaka Sawada
Affiliation:
JEOL Ltd., Akishima, Japan
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, University of Tokyo, United States

Abstract

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Type
Fast and Ultrafast Dynamics Using Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2710 - 2712
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Morishita, S et al. , Microscopy, 67 (2018) p.46.CrossRefGoogle Scholar
Batson, P.E. et al. , Microscopy and Microanalysis, 14(2008), p.89.Google Scholar
Ishikawa, R. et al. , Microscopy 69 240 (2020).CrossRefGoogle Scholar
A part of this work was supported by Grant-in-Aid for Specially Promoted Research “Atom-by-atom imaging of ion dynamics in nano-structures for materials innovation” (Grant No. JP17H06094) from JSPS.Google Scholar