Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-26T16:43:27.700Z Has data issue: false hasContentIssue false
  • English
  • Français

Cepstral Scanning Transmission Electron Microscopy Imaging of Disordered Crystals using Coherent Diffuse Scattering

Published online by Cambridge University Press:  30 July 2021

Jian-Min Zuo ,
Yu-Tsun Shao ,
Haw-Wen Hsiao ,
Renliang Yuan ,
Qun Yang  and
Yang Hu
Jian-Min Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithac, New York, United States
Haw-Wen Hsiao
Affiliation:
University of Illinois Urbana-Champaign, Urbana, Illinois, United States
Renliang Yuan
Affiliation:
University of Illinois at Urbana-Champaign, Illinois, United States
Qun Yang
Affiliation:
ShanghaiTech University, United States
Yang Hu
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2664 - 2665
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Spence, J.C.H., Zuo, J.M., Does electron holography energy-filter?, Ultramicroscopy, 69 (1997) 185-190.CrossRefGoogle Scholar
Padgett, E., Holtz, M.E., Cueva, P., Shao, Y.-T., Langenberg, E., Schlom, D.G., Muller, D.A., The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision, Ultramicroscopy, 214 (2020) 112994.CrossRefGoogle ScholarPubMed
Shao, Y.T., Yuan, R., Hsiao, H.W., Yang, Q., Hu, Y., Zuo, J.M., Cepstral scanning transmission electron microscopy imaging of severe lattice distortions, Ultramicroscopy, Under revision (2020) Preprint at https://arxiv.org/abs/2101.06503.Google Scholar
Tsai, M.H., Yeh, J.W., High-entropy alloys: a critical review, Materials Research Letters, 2 (2014) 107-123.CrossRefGoogle Scholar
Miracle, D.B., Senkov, O.N., A critical review of high entropy alloys and related concepts, Acta Materialia, 122 (2017) 448-511.CrossRefGoogle Scholar