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Electrostatic Reconstruction Technology in Atom Probe Tomography

Published online by Cambridge University Press:  30 July 2021

Brian Geiser ,
Isabelle Martin ,
David Reinhard ,
Dan Lenz ,
Ty Prosa ,
Robert Ulfig  and
David Larson
Brian Geiser
Affiliation:
CAMECA Instruments Inc., United States
Isabelle Martin
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711 USA, United States
David Reinhard
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Dan Lenz
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711 USA, United States
Ty Prosa
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA, Wisconsin, United States
Robert Ulfig
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
David Larson
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States

Abstract

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Type
Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2482 - 2483
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Geiser, B. et al. , Micro. Microanal. 26(2) (2020) p. 2622.CrossRefGoogle Scholar
Placko, D. and Kundu, T., eds. DPSM for Modeling Engineering Problems. John Wiley & Sons, (2007).Google Scholar
Geiser, B. et al. , Micro. Microanal. 15(2) (2009) p. 302.CrossRefGoogle Scholar
Larson, D. J. et al. , “Local Electrode Atom Probe Tomography: A User's Guide”, (Springer Scientific, New York, 2013).Google Scholar