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Directions in Atom Probe Tomography

Published online by Cambridge University Press:  30 July 2021

David Larson ,
Dan Lenz ,
Isabelle Martin ,
Ty Prosa ,
David Reinhard ,
Peter Clifton ,
Brian Geiser ,
Robert Ulfig  and
Joe Bunton
David Larson
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Dan Lenz
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711 USA, United States
Isabelle Martin
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711 USA, United States
Ty Prosa
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711 USA, Wisconsin, United States
David Reinhard
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Peter Clifton
Affiliation:
Cameca, United States
Brian Geiser
Affiliation:
CAMECA Instruments Inc., United States
Robert Ulfig
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States
Joe Bunton
Affiliation:
CAMECA® Instruments Inc., 5470 Nobel Drive, Madison, WI53711 USA, United States

Abstract

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Type
Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2464 - 2466
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Larson, D. J. et al. , “Local Electrode Atom Probe Tomography: A User's Guide”, (Springer Scientific, New York, 2013).CrossRefGoogle Scholar
“LEAP 5000: 3D Atom Probe Microscope”. https://www.cameca.com/products/apt/leap-5000 (accessed January 24, 2021).Google Scholar
Chiaramonti, A., et al. , Micro. Microanal. 26(S2) (2020) 258.CrossRefGoogle Scholar
Geiser, B. P., et al. , Micro. Microanal. 26(S2) (2020) 2622.CrossRefGoogle Scholar
Reinhard, D., et al. , Micro. Microanal. 26(S2) (2020) 2616.CrossRefGoogle Scholar
Ulfig, R. M. et al. , Micro. Microanal. 23(S1) (2017) 622.Google Scholar
Bostel, A. et al. , “High Resolution Wide Angle Tomographic Probe”, United States Patent 8,074,292, December 6, 2011.Google Scholar
Panayi, P., “Reflectron”, United States Patent 8,134,119, March 13, 2012.Google Scholar
Bunton, J. H. and Van Dyke, M. S., “Wide Field of View Atom Probe”, United States Patent 10,615,001, April 7, 2020.Google Scholar
Kelly, T. F. et al. , Surface Science 246 (1991) 396.CrossRefGoogle Scholar
Shariq, A. et al. , Ultramicroscopy 109 (2009) 472.CrossRefGoogle Scholar
Gerstl, S. S. A., et al. , Micro, Microanal, 15(S2) (2009) 248.CrossRefGoogle Scholar