Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Surface and Subsurface Microscopy and Microanalysis

Abstract

A High Multiple Hits Correction Factor for Atom Probe Tomography

XPS Study of Corrosion Deposit in Stainless Steel Hardfacing

Visualization of Impurities on the Surface of Frozen Samples by Environmental Scanning Electron Microscopy

Study of Molecular Composition and Chemical Group Presents in Plants Extracts by Using Mass Spectrometry and FTIR

Analysis of Raman Spectroscopy and SEM of Carbon Nanotubes Obtain by CVD

Characterization of Carbon Nanotubes with TiO2 by the (CVD) Chemical Vapor Deposition Method

Preparation of a Model Platinum/Gamma-Alumina Catalyst for in situ Environmental TEM Experiments

Synthesis and Characterization of Silica Nanoparticles Obtained by Additions of Amino Acids into the Stöber Reaction

The Benefits of Consistently Orientated Samples for Coincident Data Collection

Comparative Study of TiN/SiC and CrN/SiC multilayer systems produced by PVD.

Modification of Microstructure of Pure Al using Shot Peening Treatment

Microstructural Study of Internal Oxidation of Dilute Ni-Al Alloys

Effect of Ultrasonic Shot Peening on Microstructural Evolution of Duplex Stainless Steel S32750

Synthesis and Characterization of HfC/SiC Ceramic Nanoparticles

Effect on Microstructure and Nanoindentation of a AlCoFeMoNi High Entropy Alloy.

Synthesis and Characterization of Tio2/C Composite for Photocatalytic Degradation of Dyes.

Vendor Symposium

Abstract

S9000X - Next Generation of Ultra-High Resolution SEM for Enhanced Analysis and Xe Plasma FIB for Ultra-Fast and Gentle Sputtering

Removal of Ga Implantation on FIB-prepared Atom Probe Specimens Using Small Beam and Low Energy Ar+ Milling

Influence of SEM Deposited Protection Layers on FIB Induced Amorphous Damage of TEM Lamella Prepared by ExSolve WTP

A Versatile All-in-One Automated Processor for Electron Microscopy

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Surface and Subsurface Microscopy and Microanalysis

Abstract

Vendor Symposium

Abstract