Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Sterling Newberry Memorial Symposium on X-ray Imaging

Abstract

In situ Imaging of Materials using X-ray Tomography

Using Micro-Computed Tomography to Investigate Powder Distribution Trends Within 3D Binder-Jet Printed SS316 Parts

High-efficiency Fast X-Ray Imaging Detector Development at SSRF

Novel sub-eV high throughput laboratory micro-XAS (x-ray absorption spectrometer) for chemical state analysis through XANES and EXAFS

4D and In Situ X-ray Microscopy for Studying Damage Evolution in Materials Across Multiple Length Scales

Full-field X-ray Nano-scope Developed at SSRF

Surface and Subsurface Microscopy and Microanalysis

Abstract

What do Cells and Photovoltaic Materials Have in Common? TOF-SIMS Tandem MS Imaging and the Identification of Chemistry at < 100 nm Resolving Power

Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials

Surface Characterization of Biologically Related Systems with Imaging TOF-SIMS and Complementary Techniques

Ablation and Microstructure Imaging of Dentin-Enamel Junction Using Focused Electron Beam in an Environmental Scanning Electron Microscope

Imaging the Endoplasmic Reticulum within Individual Mammalian Cells with Secondary Ion Mass Spectrometry

Improving the Understanding of Catalytic Processes using Field Emission Techniques: The Case of NO+H2 on Pd-Au.

TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel

Understanding Conditions Affecting Background in Atom Probe Tomography with Implications for Analysis of Hydrogen

Auger Electron Spectroscopy - History and Applications in Materials Characterization with Emphasis on Medical Devices

Spherical Particles in Al65Cu20Fe15 Alloy Prepared by Arc Melting

Recent Developments in XPS - Microspectroscopy, Spectromicroscopy, Lateral and Depth Information towards Cutting-Edge Solid Electrolytes and Biomaterials

Observation of Lithium fluorescence X-ray utilizing Superconducting-Tunnel-Junction Array X-ray detector toward in situ mapping analyses of precipitated metal lithium in sold electrolytes of Li-ion batteries

Multidimensional Imaging of Surfaces with Ringing Mode of Atomic Force Microscopy

Nanoscale Hyperspectral Characterization of Source Rock in Unconventional Reservoirs using Photo-Induced Force Microscopy

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Sterling Newberry Memorial Symposium on X-ray Imaging

Abstract

Surface and Subsurface Microscopy and Microanalysis

Abstract