Hostname: page-component-7bb8b95d7b-w7rtg Total loading time: 0 Render date: 2024-10-04T15:54:05.961Z Has data issue: false hasContentIssue false
  • English
  • Français

A High Multiple Hits Correction Factor for Atom Probe Tomography

Published online by Cambridge University Press:  01 August 2018

D.J. Larson ,
T.J. Prosa ,
E. Oltman ,
D.A. Reinhard ,
B.P. Geiser ,
R.M. Ulfig  and
A. Merkulov
D.J. Larson
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
T.J. Prosa
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
E. Oltman
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
D.A. Reinhard
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
B.P. Geiser
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
R.M. Ulfig
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
A. Merkulov
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1084 - 1085
Copyright
© Microscopy Society of America 2018 

References

[1] Jagutzki, O, et al., IEEE Trans. Nucl. Sci. 49 2002) p. 2477.Google Scholar
[2] Da Costa, G, et al., Rev. Sci. Instrum. 76 2005) p. 013304–0133041.Google Scholar
[3] Miller, MK Smith, GDW. Atom Probe Microanalysis: Principles and Applications to Materials Problems, (Materials Research Society, Pittsburgh) 1989.Google Scholar
[4] Da Costa, G, et al., Rev. Sci. Instrum. 83 2012) p. 123709.Google Scholar
[5] Ronsheim, P, et al., Appl. Surf. Sci. 255 2008) p. 1547.Google Scholar
[6] Blavette, D, et al., Mater. Sci. Eng. A. 7 2011) p. 012004–0120041.Google Scholar
[7] Philippe, T, et al., Ultramicroscopy. 109 2009) p. 1304.Google Scholar
[8] Larson, DJ, et al., Microsc. Microanal. 20 2014) p. 2088.Google Scholar
[9] Stevie, F. Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization. Momentum Press 2015.Google Scholar