Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-27T07:36:49.211Z Has data issue: false hasContentIssue false

A High Multiple Hits Correction Factor for Atom Probe Tomography

Published online by Cambridge University Press:  01 August 2018

D.J. Larson
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
T.J. Prosa
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
E. Oltman
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
D.A. Reinhard
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
B.P. Geiser
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
R.M. Ulfig
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
A. Merkulov
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Jagutzki, O, et al., IEEE Trans. Nucl. Sci. 49 2002) p. 2477.Google Scholar
[2] Da Costa, G, et al., Rev. Sci. Instrum. 76 2005) p. 0133040133041.Google Scholar
[3] Miller, MK Smith, GDW. Atom Probe Microanalysis: Principles and Applications to Materials Problems, (Materials Research Society, Pittsburgh) 1989.Google Scholar
[4] Da Costa, G, et al., Rev. Sci. Instrum. 83 2012) p. 123709.Google Scholar
[5] Ronsheim, P, et al., Appl. Surf. Sci. 255 2008) p. 1547.Google Scholar
[6] Blavette, D, et al., Mater. Sci. Eng. A. 7 2011) p. 0120040120041.Google Scholar
[7] Philippe, T, et al., Ultramicroscopy. 109 2009) p. 1304.Google Scholar
[8] Larson, DJ, et al., Microsc. Microanal. 20 2014) p. 2088.Google Scholar
[9] Stevie, F. Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization. Momentum Press 2015.Google Scholar