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A High Multiple Hits Correction Factor for Atom Probe Tomography

Published online by Cambridge University Press:  01 August 2018

D.J. Larson ,
T.J. Prosa ,
E. Oltman ,
D.A. Reinhard ,
B.P. Geiser ,
R.M. Ulfig  and
A. Merkulov
D.J. Larson
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
T.J. Prosa
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
E. Oltman
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
D.A. Reinhard
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
B.P. Geiser
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
R.M. Ulfig
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA
A. Merkulov
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI53711USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1084 - 1085
Copyright
© Microscopy Society of America 2018 

References

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