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Influence of SEM Deposited Protection Layers on FIB Induced Amorphous Damage of TEM Lamella Prepared by ExSolve WTP
Published online by Cambridge University Press: 01 August 2018
Abstract
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- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1120 - 1121
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- © Microscopy Society of America 2018