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Simulation of sub-micron indentation tests with spherical and Berkovich indenters

Published online by Cambridge University Press:  31 January 2011

A. C. Fischer-Cripps
A. C. Fischer-Cripps*
Affiliation:
CSIRO Division of Telecommunications and Industrial Physics, P.O. Box 218, Lindfield, NSW 2070 Australia
*
a)e-mail: [email protected]
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Abstract

The present work is concerned with the methods of simulation of data obtained from depth-sensing submicron indentation testing. Details of analysis methods for both spherical and Berkovich indenters using multiple or single unload points are presented followed by a detailed treatment of a method for simulating an experimental load–displacement response where the material properties such as elastic modulus and hardness are given as inputs. A comparison between simulated and experimental data is given.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 7 , July 2001 , pp. 2149 - 2157
Copyright
Copyright © Materials Research Society 2001

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References

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