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A new approach to characterization of the transition temperatures of thin film NiTi shape memory alloys

Published online by Cambridge University Press:  03 March 2011

Nicholas W. Botterill ,
David M. Grant ,
Jianxin Zhang  and
Clive J. Roberts
Nicholas W. Botterill
Affiliation:
School of Mechanical, Materials, Manufacturing and Management, University of Nottingham, Nottingham NG7 2RD, United Kingdom
David M. Grant*
Affiliation:
School of Mechanical, Materials, Manufacturing and Management, University of Nottingham, Nottingham NG7 2RD, United Kingdom
Jianxin Zhang
Affiliation:
Laboratory of Biophysics and Surface Analysis, School of Pharmaceutical Science,University of Nottingham, Nottingham NG7 2RD, United Kingdom
Clive J. Roberts
Affiliation:
Laboratory of Biophysics and Surface Analysis, School of Pharmaceutical Science,University of Nottingham, Nottingham NG7 2RD, United Kingdom
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

A novel approach in determining the transition temperatures of NiTi shape memory alloys was investigated and compared with conventional techniques. The technique is based on microthemal analysis using a scanning thermal microscope (SThM). In particular, this method has the potential to allow the transformation temperatures of thin films to be investigated in situ. Thin film shape memory alloys have potential applications, such as microactuators, where conventional analysis techniques are either not directly applicable to such samples or are difficult to perform.

Keywords

Scanning thermal microscopy (SThM)Thin filmIntermetallic alloys
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 6 , June 2004 , pp. 1762 - 1767
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1Buehler, W.J., Gilfrich, J.V. and Wiley, R.C.: J. Appl. Phys. 34, 1475 (1963).Google Scholar
2Duerig, T.W.: Mater. Sci. Forum 56, 679 (1990).Google Scholar
3Ohkata, H. and Tamura, H.: Mater. Res. Soc. Symp. Proc. 459, 345 (1997).CrossRefGoogle Scholar
4Makino, E., Mitsuya, T. and Shibata, T.: Sens. Actuators A 79, 251 (2000).CrossRefGoogle Scholar
5Makino, E., Mitsuya, T. and Shibata, T.: Sens. Actuators A 79, 128 (2000).CrossRefGoogle Scholar
6Johnson, A.D.: J. Micromech. and Microeng. 1, 34 (1991).Google Scholar
7Pylkki, R.J., Moyer, P.J., and West, P.E.: J. Appl. Phys. (Jap.) 1, 3785 (1994).CrossRefGoogle Scholar
8Botterill, N.W. Ph.D. Thesis, University of Nottingham (2002).Google Scholar
9Miyazaki, S., Ishida, A., and Takei, A.: In ISMCR-92: Proc. of the Second International Symp. on Measurement and Control in Robotics, 495 (1992).Google Scholar
10Goo, E. and Sinclair, R.: Acta Metall. 33, 1717 (1985).Google Scholar
11Otsuka, K. and Ren, X.: Intermetallics 7, 511 (1999).CrossRefGoogle Scholar
12Wu, S.K. and Lin, H.C.: Mater. Chem. Phys. 64, 81 (2000).Google Scholar
13Brandes, E.A. and Brook, G.B.Smithells Metals Reference Book, 7th ed. (Butterworth-Heinemann, Oxford, U.K., 2000), pp. 14–25.Google Scholar
14Uchil, J., Mohanchandra, K.P., Kumara, K. Ganesh and Mahesh, K.K.: Physica B 270, 289 (1999).Google Scholar
15Pollock, H.M. and Hammiche, A.: J. Phys. D34 R23 (2001).Google Scholar
16Gorbunov, V.V., Fuchigami, N. and Tsukruk, V.V.: High Perform. Polym. 12, 603 (2000).CrossRefGoogle Scholar
17 Topometrix/ThermoMicroscopes Website (2002).Google Scholar