Hostname: page-component-7bb8b95d7b-fmk2r Total loading time: 0 Render date: 2024-09-13T06:38:45.900Z Has data issue: false hasContentIssue false

Modeling of electric field induced texture in lead zirconate titanate ceramics

Published online by Cambridge University Press:  31 January 2011

Shan Wan
Affiliation:
School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332
Keith Bowman
Affiliation:
School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907
Get access

Abstract

Preferred domain orientation of a piezoelectric ceramic develops through domain switching under electric poling. In previous investigations the critical free energy required for domain switching has been assumed as a constant. This assumption leads to overestimation of the poling-induced texture and provides no explanation for the switching reversal in ferroelectric ceramics after the poling field is removed. In this paper, the contribution of intergranular stress to critical energy for 90° domain switching is investigated. A criterion including intrinsic threshold energy and an interaction energy, which is related to the intergranular stress and the intergranular depolarization field, is proposed. The texture evolution during poling process is simulated using a computational model starting from an initial random domain orientation distribution. The resulted domain orientation distributions under and after poling are predicted. The remanent domain switching after poling is the result of the balance between the interaction energy and intrinsic threshold energy. The final texture is much weaker than that under the electric field. Pole figures of poled Navy VI lead zirconate titanate measured by x-ray diffraction are consistent with the predicted textures.

Type
Articles
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Jaffe, B., Cook, W.R., and Jaffe, H., Piezoelectric Ceramics (Academic Press, London, United Kingdom, and New York, 1971).Google Scholar
2Baerwald, H., Phys. Rev. 105, 480 (1957).CrossRefGoogle Scholar
3Redin, R., Marks, G., and Antoniak, C., J. Appl. Phys. 34, 600 (1963).CrossRefGoogle Scholar
4Berlincourt, D. and Krueger, H.H.A., J. Appl. Phys. 30, 1804 (1959).CrossRefGoogle Scholar
5Cao, H. and Evans, A.G., J. Am. Ceram. Soc. 76, 890 (1993).CrossRefGoogle Scholar
6Schaufele, A. and Hardtl, K., J. Am. Ceram. Soc. 79, 2637 (1996).CrossRefGoogle Scholar
7Bowman, K.J., J. Am. Ceram. Soc. 74, 2690 (1991).Google Scholar
8Hwang, S.C., Lynch, C.S., and McMeeking, R.M., Acta Metall. Mater. 43, 2073 (1995).Google Scholar
9Chen, X., Fang, D.N., and Hwang, C., Acta. Mater. 45, 3181 (1997).CrossRefGoogle Scholar
10Michelitsch, T. and Kreher, W.S., Acta Mater. 46, 5085 (1998).Google Scholar
11Chen, W. and Lynch, C.S., Acta. Mater. 46, 5303 (1998).CrossRefGoogle Scholar
12Huber, J., Fleck, N., Landis, C., and McMeeking, R., J. Mech. Phys. Solids 47, 1663 (1999).CrossRefGoogle Scholar
13Yamada, A., Chung, Y., Takahashi, M., and Ogawa, T., Jpn. J. Appl. Phys. 35, 5232 (1996).CrossRefGoogle Scholar
14Ng, Y. and McDonald, A., Ferroelectrics 62, 167 (1985).Google Scholar
15Hamaguchi, H., J. Am. Ceram. Soc. 82, 1459 (1999).CrossRefGoogle Scholar
16Hwang, S.C., Huber, J.E., McMeeking, R.M., and Fleck, N.A., J. Appl. Phys. 84, 1530 (1998).CrossRefGoogle Scholar
17Lynch, C.S., Acta Mater. 44, 4137 (1998).CrossRefGoogle Scholar
18Uchida, N. and Ikeda, T., Jpn. J. Appl. Phys. 6, 1079 (1967).CrossRefGoogle Scholar
19Lines, M. and Glas, A., Principles and Applications of Ferroelec-trics and Related Materials (Clarendon Press, Oxford, United Kingdom, 1977).Google Scholar
20Arlt, G., Dederichs, H., and Herbiet, R., Ferroelectric 74, 37 (1987).CrossRefGoogle Scholar
21Subbarao, S., McQuarrie, M., and Buessem, W., J. Appl. Phys. 28, 1194 (1957).Google Scholar
22Cheng, B., Gabbay, M., and Fantozzi, G., J. Mater. Sci. 31, 4141 (1996).CrossRefGoogle Scholar
23Rudyak, R., Ferroelectrics 48, 131 (1983).CrossRefGoogle Scholar
24Wan, S., Shelley, W.F. II, and Bowman, K.J., Mater. Sci. Forum 273, 581 (1998).Google Scholar
25Wan, S. and Bowman, K.J., J. Mater. Res. 15, 1248 (2000).Google Scholar
26Origin 5.1, Microcal Software, Inc., Northampton, MA, (1997).Google Scholar
27Zhang, X., Ye, C., and Li, C., Acta Phys. Sin. 28, 524 (1979).Google Scholar