Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-23T09:09:11.590Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructure of laser-ablated superconducting La2CuO4Fx thin films on SrTiO3

Published online by Cambridge University Press:  31 January 2011

G. Kong ,
M. O. Jones ,
J. S. Abell ,
P. P. Edwards ,
S. T. Lees ,
K. E. Gibbons ,
I. Gameson  and
M. Aindow
G. Kong
Affiliation:
School of Metallurgy and Materials, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, United Kingdom
M. O. Jones
Affiliation:
School of Metallurgy and Materials, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, United Kingdom
J. S. Abell
Affiliation:
School of Metallurgy and Materials, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, United Kingdom
P. P. Edwards*
Affiliation:
School of Chemistry and the School of Metallurgy and Materials, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, United Kingdom
S. T. Lees
Affiliation:
School of Chemistry, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, United Kingdom
K. E. Gibbons
Affiliation:
School of Chemistry, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, United Kingdom
I. Gameson
Affiliation:
School of Chemistry, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, United Kingdom
M. Aindow
Affiliation:
Department of Metallurgy and Materials Engineering, Institute of Materials Science, 97 North Eagleville Road, Unit 3136, University of Connecticut, Storrs, Connecticut 06269–3136
*
b) Address all correspondence to this author.
Get access

Abstract

Thin films of lanthanum cuprate were grown on SrTiO3 substrates by pulsed laser deposition and made superconducting (Tc ∼ 38 K) through the process of post-deposition fluorination using elemental fluorine. A microstructural analysis showed that the [110] zone of the film grows parallel to the [100] zone of the SrTiO3 substrate, reducing the lattice mismatch from 37.5% to 2.4%. At the film–substrate interface there is an intermediate layer 3–4 nm thick and twin-related grains emanate from this region. Stacking faults are present in the bulk of the film, with misoriented subgrains present at the deposit surface.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 11 , November 2001 , pp. 3309 - 3316
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Cotell, C.M. and Granbowski, K.S., MRS Bull. 17, 44 (1992).CrossRefGoogle Scholar
2.Williams, R.S., Yuan, H., Feiler, D., Tang, J., Siebentritt, S., and Treece, R.E., Abstracts of Papers of the Am. Chem. Soc. 208, 53 (1994).Google Scholar
3.Krebs, H.U., Fahler, S., and Bremert, O., Appl. Surf. Sci. 84, 86 (1995).CrossRefGoogle Scholar
4.Guyot, M., Lisfi, A., Krishnan, R., Porte, M., Rougier, P., and Cagan, V., Appl. Surf. Sci. 96, 802 (1996).CrossRefGoogle Scholar
5.Lowndes, D.H., Geohegan, D.B., Puretzky, A.A., Norton, D.P., and Rouleau, C.M., Science 273, 898 (1996).CrossRefGoogle Scholar
6.Bednorz, J.G. and Müller, K.A., Z. Phys. B 64, 189 (1986).CrossRefGoogle Scholar
7.Tarascon, J.M., Greene, L.H., McKinnon, W.R., Hull, G.W., and Geballe, T.H., Science 235, 1373 (1987).CrossRefGoogle Scholar
8.Torrance, J.B., Bezinge, A., Nazzal, A.I., Huang, T.C., Parkin, S.S.P., Keane, D.T., LaPlaca, S.J., Horn, P.M., and Held, G.A., Phys. Rev. B 40, 8872 (1989).CrossRefGoogle Scholar
9.Axe, J.D., Moudden, A.H., Hohlwein, D., Cox, D.E., Mohanty, K.M., Moodenbaugh, A.R., and Xu, Y., Phys. Rev. Lett. 62, 2751 (1989).CrossRefGoogle Scholar
10.Subramanian, M.A., Gopalakrishnan, J., Torardi, C.C., Askew, T.R., Flippen, R.B., Sleight, A.W., Lin, J.J., and Poon, S.J., Science 240, 495 (1988).CrossRefGoogle Scholar
11.Torardi, C.C., Subramanian, M.A., Gopalakrishnan, J., and Sleight, A.W., Physica C 158, 465 (1989).CrossRefGoogle Scholar
12.Beille, J., Chevalier, B., Demazeau, G., Deslandes, F., Etourneau, J., Laborde, O., Michel, C., Lejay, P., Provost, J., Raveau, B., Sulpice, A., Tholence, J.L., and Tournier, R., Physica B 146, 307 (1987).CrossRefGoogle Scholar
13.Demazeau, G., Tresse, F., Plante, T., Chevalier, B., Etourneau, J., Michel, C., Hervieu, M., Raveau, B., Lejay, P., Sulpice, A., and Tournier, R., Physica C 153–155, 824 (1988).CrossRefGoogle Scholar
14.Schirber, J.E., Morosin, B., Merrill, R.M., Hlava, P.F., Venturini, E.L., Kwak, J.F., Nigrey, P.J., Baughman, R.J., and Ginley, D.S., Physica C 152, 121 (1988).CrossRefGoogle Scholar
15.Wattiaux, A., Park, J.C., Grenier, J.C., and Pouchard, M., Acad, C.R.. Sci. Paris 310, 1047 (1990).Google Scholar
16.Grenier, J.C., Wattiaux, A., Lagueyte, N., Park, J.C., Marquestaut, E., Etourneau, J., and Pouchard, M., Physica C 173, 139 (1991).CrossRefGoogle Scholar
17.Grenier, J.C., Lagueyte, N., Wattiaux, A., Doumerc, J.P., Dordor, P., Etourneau, J., Pouchard, M., Goodenough, J.B., and Zhou, J.S., Physica C 202, 209 (1992).CrossRefGoogle Scholar
18.Rudolf, P. and Schöllhorn, R., J. Chem. Soc., Chem. Commun. 1158 (1992).CrossRefGoogle Scholar
19.Tissue, B.M., Cirillo, K.M., Wright, J.C., Daeumling, M., and Larbalestier, D.C., Solid State Comm. 65, 51 (1988).CrossRefGoogle Scholar
20.Takayama-Muromachi, E., Sasaki, T., and Matsui, Y., Physica C 207, 97 (1993).CrossRefGoogle Scholar
21.Takayama-Muromachi, E. and Navrotsky, A., Physica C 218, 164 (1993).CrossRefGoogle Scholar
22.Chevalier, B., Tressaud, A., Lepine, B., Amine, K., Dance, J. M., Lozano, L., Hickey, E., and Etourneau, J., Physica C 167, 97 (1990).CrossRefGoogle Scholar
23.Chevalier, B., Tressaud, A., Lepine, B., Robin, C., and Etourneau, J., J. Less-Common Met. 164–165, 832 (1990).CrossRefGoogle Scholar
24.Chevalier, B., Tressaud, A., Robin, C., Lepine, B., Tuilier, M.H., Soubeyroux, J.L., and Etourneau, J.. ICMAS 91, edited by Raveau, B., Wasa, K., and Suryanaryanan, R. (IITT, Paris, France, 1991), p. 21.Google Scholar
25.Tuilier, M.H., Chevalier, B., Tressaud, A., Brisson, C., Soubeyroux, J.L., and Etourneau, J., Physica C 200, 113 (1992).CrossRefGoogle Scholar
26.Lees, S.T., Gameson, I., Jones, M.O., Edwards, P.P., Greaves, C., Wellhofer, F., Woodall, P., Langford, I., and Slaski, M., Physica C 270, 305 (1996).CrossRefGoogle Scholar
27.Lees, S.T., Jones, M.O., Edwards, P.P., Gameson, I., Slaski, M., Rial, C., Amador, U., and Moran, E., Adv. Mater. 9, 823 (1997).CrossRefGoogle Scholar
28.Lees, S.T., Gameson, I., Jones, M.O., Slaski, M., and Edwards, P., Chem. Mater. 10, 3146 (1998).CrossRefGoogle Scholar
29.Moorthy, A., Schmierer, J., and McCarthy, G., JCPDS [38-709] Grant-in-Aid Report (1987).Google Scholar
30.Radaelli, P.G., Jorgensen, J.D., Kleb, R., Hunter, B.A., Chou, F.C., and Johnston, D.C., Phys. Rev. B 49, 6239 (1994).CrossRefGoogle Scholar
31.Radaelli, P.G., Jorgensen, J.D., Schultz, A.J., Hunter, B.A., Wagner, J.L., Chou, F.C., and Johnston, D.L., Phys. Rev. B 48, 499 (1993).CrossRefGoogle Scholar
32.Jorgensen, J.D., Dabrowski, B., Pei, S., Hinks, D.G., Soderholm, L., Morosin, B., Schirber, J.E., Venturini, E.L., and Ginley, D.S., Phys. Rev. B 38, 11337 (1988).CrossRefGoogle Scholar
33.Chaillout, C., Cheong, S.W., Fisk, Z., Lehmann, M.S., Marezio, M., Morosin, B., and Schirber, J.E., Physica C 158, 183 (1989).CrossRefGoogle Scholar
34.Chaillout, C., Chenavas, J., Cheong, S.W., Fisk, Z., Marezio, M., Morosin, B., and Schirber, J.E., Physica C 170, 87 (1990).CrossRefGoogle Scholar
35.Locquet, J-P., Arrouy, F., Machler, E., Despont, M., Bauer, P., and Williams, E., J. Appl. Phys. Lett. 68, 1999 (1996).CrossRefGoogle Scholar
36.Vaknin, D., Zarestky, J.L., Johnston, D.C., Schirber, J.E., and Fisk, Z., Phys. Rev. B 49, 9057 (1994).CrossRefGoogle Scholar
37.Beille, J., Cabanel, R., Chaillout, C., Chevalier, B., Demazeau, G., Deslandes, F., Etourneau, J., Lejay, P., Michel, C., Provost, J., Raveau, B., Sulpice, A., Tholence, J.L., and Tournier, R., C.R.Acad. Sc. Paris 304, 1097 (1987).Google Scholar
38.Jorgensen, J.D., Dabrowski, B., Pei, S., Hinks, D.G., Soderholm, L., Morosin, B., Schirber, J.E., Venturini, E.L., and Ginley, D.S., Phys. Rev. B 38, 11337 (1988).CrossRefGoogle Scholar
39.Bean, C.P., Rev. Mod. Phys. 36, 31 (1964).CrossRefGoogle Scholar
40.Gyorgy, E.M., van Dover, R.B., Jackson, K.A., Schneemeyer, L.F., and Waszczak, J.V., Appl. Phys. Lett. 55, 283 (1989).CrossRefGoogle Scholar