Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-05T16:24:30.377Z Has data issue: false hasContentIssue false

Microstructure and microwave properties of YBCO thin films grown on MgO and SrTiO3 by CVD

Published online by Cambridge University Press:  31 January 2011

K.H. Young
Affiliation:
Superconductor Technologies Inc., 460-F Ward Drive, Santa Barbara, California 93111
McD. Robinson
Affiliation:
Superconductor Technologies Inc., 460-F Ward Drive, Santa Barbara, California 93111
G.V. Negrete
Affiliation:
Superconductor Technologies Inc., 460-F Ward Drive, Santa Barbara, California 93111
T. Yamashita
Affiliation:
Department of Electronics, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
T. Hirai
Affiliation:
Institute for Materials Research, Tohoku University, Sendai, Miyagi 980, Japan
H. Suzuki
Affiliation:
Technological Research Center, Riken Corporation, Kumagaya 810, Saitama 360, Japan
H. Kurosawa
Affiliation:
Technological Research Center, Riken Corporation, Kumagaya 810, Saitama 360, Japan
L. Drabeck
Affiliation:
Department of Physics, University of California–Los Angeles, Los Angeles, California 90024
G. Grüner
Affiliation:
Department of Physics, University of California–Los Angeles, Los Angeles, California 90024
Get access

Abstract

The microstructure and microwave properties of YBa2Cu3O7−δ thin films grown on SrTiO3 (100) and MgO (100) substrates by chemical vapor deposition have been studied. Both 100 GHz cavity measurement of surface resistance and ground plane substitution in a 5 GHz microstrip resonator show that films on SrTiO3 have better microwave properties than those on MgO. Although there are some a-axis grains and secondary phases on the surface, a large fraction of each film on SrTiO3 is epitaxial with its c axis normal to the substrate. The 100 GHz surface resistance of these films is less than copper for temperature ⋚ 82 K, and approaches the detection limit at 10–20 K. For the films on MgO, c-axis grains of different in-plane rotation are found together with some a-axis needle-like grains. The grain boundaries are detrimental to the microwave properties, and the resulting surface resistance at 100 GHz and 10–20 K is about 20 mΩ higher than that of films on SrTiO3.

Type
Articles
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Olson, W. L., Eddy, M. M., James, T. W., Hammond, R. B., Grüner, G., and Drabeck, L., Appl. Phys. Lett. 55, 188 (1989).CrossRefGoogle Scholar
2.Hammond, R. B., Negrete, G. V., Bourne, L. C., Strother, D. D., Cardona, A. H., and Eddy, M. M., Appl. Phys. Lett. 57, 825 (1990).CrossRefGoogle Scholar
3.Chang, L. D., Moskowitz, M. J., Hammond, R. B., Eddy, M. M., Olson, W. L., Casavant, D. D., Smith, E. J., Robinson, M., Drabeck, L., and Grüner, G., Appl. Phys. Lett. 55, 1357 (1989).CrossRefGoogle Scholar
4.Cooke, D. W., Gray, E. R., Houlton, R. J., Rusnak, B., Meyer, E. A., Beery, J. G., Brown, D. R., Garzon, F. H., Raistrick, I. D., Rollet, A. D., and Bolmaro, R., Appl. Phys. Lett. 55, 914 (1989).CrossRefGoogle Scholar
5.Inam, A., Wu, X. D., Nazar, L., Hegde, M. S., Rogers, C. T., Venkatesan, T., Simon, R. W., Daly, K., Padamsee, H., Kirchgessner, J., Moffat, D., Rubin, D., Shu, Q. S., Kalokitis, D., Fathy, A., Pendrick, V., Brown, R., Brycki, B., Belohoubek, E., Drabeck, L., Grüner, G., Hammond, R., Gamble, F., Lairson, B. M., and Bravman, J. C., Appl. Phys. Lett. 56, 1178 (1990).CrossRefGoogle Scholar
6.Klein, N., Muller, G., Piel, H., Roas, B., Schulz, L., Klain, U., and Peiniger, M., Appl. Phys. Lett. 54, 757 (1989).CrossRefGoogle Scholar
7.Char, K., Newman, N., Garrison, S. M., Barton, R. W., Taber, R. C., Laderman, S. S., and Jacowitz, R. D., Appl. Phys. Lett. 57, 409 (1990).CrossRefGoogle Scholar
8.Newman, N., Char, K., Garrison, S. M., Barton, R. W., Taber, R. C., Eom, C. B., Geballe, T. H., and Wilkens, B., Appl. Phys. Lett. 57, 520 (1990).CrossRefGoogle Scholar
9.Wahl, G. and Schmaderer, F., J. Mater. Sci. 24, 1141 (1989).CrossRefGoogle Scholar
10.Yamane, H., Masumoto, H., Hirai, T., Iwasaki, H., Watanabe, K., Kobayashi, N., Muto, Y., and Kurosawa, H., Appl. Phys. Lett. 53, 1548 (1988).CrossRefGoogle Scholar
11.Berry, A. D., Gaskill, D. K., Holm, R. T., Cukauskas, E. J., Kaplan, R., and Henry, R. L., Appl. Phys. Lett. 52, 1743 (1988).CrossRefGoogle Scholar
12.Richeson, D., Tonge, L. M., Zhao, J., Zhang, J., Marcy, H. O., Marks, T. J., Wessels, B. W., and Kannewurf, C. R., Appl. Phys. Lett. 54, 2154 (1989).CrossRefGoogle Scholar
13.Zhang, K., Boyd, E. P., Kwak, B. S., Wright, A. C., and Erbil, A., Appl. Phys. Lett. 55, 1258 (1989).CrossRefGoogle Scholar
14.Yamane, H., Kurosawa, H., Hirai, T., Iwasaki, H., Kobayashi, N., and Muto, Y., Jpn. J. Appl. Phys. 27, L1495 (1988).CrossRefGoogle Scholar
15.Luine, J., Daly, K., Hu, R., Kain, A., Lee, A., Manasevit, H., Pettiette-Hall, C., Simon, R., John, D. St., and Wagner, M., IEEE Trans. Magn. 27, 1528 (1991).CrossRefGoogle Scholar
16.Watanabe, K., Yamane, H., Kurosawa, H., Hirai, T., Kobayashi, N., Noto, K., and Muto, Y., Appl. Phys. Lett. 54, 575 (1989).CrossRefGoogle Scholar
17.Yamane, H., Kurosawa, H., Hirai, T., Watanabe, K., Iwasaki, H., Kobayashi, N., and Muto, Y., Supercond. Sci. Technol. 2, 115 (1989).CrossRefGoogle Scholar
18.Young, K. H., Sun, J. Z., James, T. W., and Nilsson, B. J. L., in Defects in Materials (Mater. Res. Soc. Symp. Proc. 209, Pittsburgh, PA, 1991), p. 831.Google Scholar
19.Scharen, M. J., Sun, J. Z., Hammond, R. B., and Bourne, L. C., presented at MRS 1990 Fall Meeting, Boston (1990).Google Scholar
20.Carini, J. P., Awasthi, A. M., Beyerman, W., Grüner, G., Hylton, T., Char, K., Beasley, M. R., and Kapitulnik, A., Phys. Rev. B 37, 12 (1988).Google Scholar
21.Suzuki, H., Kurosawa, H., Miyagawa, K., Hirotsu, Y., Era, M., Yamashita, T., Yamane, H., and Hirai, T., Jpn. J. Appl. Phys. 29, L1648 (1990).CrossRefGoogle Scholar
22.Dimos, D., Chaudhari, P., and Mannhart, J., Phys. Rev. B 41, 4038 (1990).CrossRefGoogle Scholar
23.Suzuki, H., Kurosawa, H., Miyagawa, K., Hirotsu, Y., Era, M., Yamashita, T., Yamane, H., and Hirai, T., IEEE Trans. Magn. 27, 3320 (1991).CrossRefGoogle Scholar
24.Irie, A., Sasahara, H., Yamashita, T., Kurosawa, H., Yamane, H., and Hirai, T., IEEE Trans. Magn. 27, 3032 (1991).CrossRefGoogle Scholar