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Microstructural analysis of high-pressure compressed C60

Published online by Cambridge University Press:  31 January 2011

K. Miyazawa ,
H. Satsuki ,
M. Kuwabara  and
M. Akaishi
K. Miyazawa
Affiliation:
Department of Materials Engineering, School of Engineering, University of Tokyo, 7–3-1 Hongo, Bunkyo-ku, Tokyo, 113–8656, Japan
H. Satsuki
Affiliation:
Department of Materials Engineering, School of Engineering, University of Tokyo, 7–3-1 Hongo, Bunkyo-ku, Tokyo, 113–8656, Japan
M. Kuwabara
Affiliation:
Department of Materials Engineering, School of Engineering, University of Tokyo, 7–3-1 Hongo, Bunkyo-ku, Tokyo, 113–8656, Japan
M. Akaishi
Affiliation:
NIRIM, Namiki 1–1, Tsukuba, 305, Japan
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Abstract

The structure and hardness of C60 bulk specimens compressed under 5.5 GPa at room temperature to 600 °C are investigated by high-resolution transmission electron microscopy, x-ray diffraction, and micro-Vickers hardness tests. A strong accumulation of the [1 1 0]tr orientation of high-pressure-treated C60 specimens was developed along the compression axis, and stacking faults and nano-sized deformation twins were introduced into the C60 specimens compressed at 450–600 °C. Curved lattice planes indicating a polymerization of C60 were observed by high resolution transmission electron microscopy (HRTEM). The polymerization of the high-pressure-compressed C60 is also supported by the computer simulation of HRTEM images.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 7 , July 2001 , pp. 1960 - 1966
Copyright
Copyright © Materials Research Society 2001

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