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Erbium doping into lithium niobate and sapphire single crystal wafers

Published online by Cambridge University Press:  31 January 2011

P. Nekvindova ,
J. Spirkova-Hradilova ,
J. Schröfel  and
V. Perina
P. Nekvindova
Affiliation:
Department of Inorganic Chemistry, Institute of Chemical Technology of Prague, Technická5, 166 28 Prague, Czech Republic
J. Spirkova-Hradilova
Affiliation:
Department of Inorganic Chemistry, Institute of Chemical Technology of Prague, Technická5, 166 28 Prague, Czech Republic
J. Schröfel
Affiliation:
Department of Microelectronics, Faculty of Electrical Engineering, Czech Technical University, Technicka 3, 166 27 Prague, Czech Republic
V. Perina
Affiliation:
Department of Neutron Physics, Nuclear Physics Institute, Czech Academy of Sciences, 250 68 Rez, Czech Republic
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Abstract

The possibility of localized doping by Er3+ diffusion at moderate (less than 500 °C) temperature was for the first time demonstrated for sapphire single crystal wafers. The doping was achieved by immersing the substrate wafers into reaction melt containing small amounts of erbium salt. The crucial point of the presented technology was a crystallographic orientation of the used wafers. The most suitable orientation of the cuts was the “X-cut” with orientation (11–20). The strong anisotropy of the moderate temperature Er3+ doping into lithium niobate and sapphire was explained on the basis of the crystal structure of particular cuts.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 16 , Issue 2 , February 2001 , pp. 333 - 335
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1.Gabrielyan, V.T., Kaminski, A.A., Li, L., Phys. Stat. Sol. (a) 3, K37 (1970).CrossRefGoogle Scholar
2.Baumann, I., Brinkmann, R., Dinand, M., Sohler, W., Beckers, L., Buchal, Ch., Fleuster, M., Holzbrecher, H., Paulus, H., Müller, K-H., Gog, Th., Materlik, G., Witte, O., Stolz, H., and von der Osten, W., Appl. Phys. A: Solid Surf. 64, 33 (1997).CrossRefGoogle Scholar
3.Lorenzo, A., Jaffrezic, H., Roux, B., Boulon, G., and Garcia-Solé, J., Appl. Phys. Lett. 67, 3735 (1995).CrossRefGoogle Scholar
4.Gill, D.M., Wright, J.C., and McCaughan, L., Appl. Phys. Lett., 64, 2483 (1994).CrossRefGoogle Scholar
5.Sohler, W.. Proc. SPIE 1583, 119 (1991).Google Scholar
6.Huang, C.H., McCaughan, L., and Gill, D.M., J. Lightwave Technol. 12, 803 (1994).CrossRefGoogle Scholar
7.Suche, H., Proceedings of the 7th European Conference on Integrated Optics, ECIO ’95, April 3–6, 1995, Delft, The Netherlands, edited by Shi, L., Spiekman, L.H., and Leijtens, X.J.M. (Delft University Press, The Netherlands, 1995), p. 565.Google Scholar
8.Hradilova, J., Kolarova, P., Schrofel, J., Ctyroky, J., Vacik, J., Perina, V., Vojtech, D., and Tagiev, E., PHOTONICS ’95 (Prague, August 23–25, 1995), European Optical Society Annual Meeting Digest Series: Vol. 2A, p. 147.Google Scholar
9.Hradilova, J., Kolarova, P., Schrofel, J., Ctyroky, J., Vacik, J., and Perina, V., Proc. SPIE 2775 (Optical Systems Design and Production II, Glasgow, May 13–16, 1996), p. 647.Google Scholar
10.Perina, V., Vacik, J., Hnatowicz, V., Cervena, J., Kolarova, P., Spirkova-Hradilova, J., and Schröfel, J., NIM B (Nuclear Instruments and Methods in Physics Research), 139, 208 (1998).Google Scholar
11.Sada, C., Borsella, E., Caccavale, F., Gonella, F., Segato, F., Korkishko, Yu. N., Fedorov, V.A., Morozova, T.M., Battaglin, A.G., and Polloni, R., Appl. Phys. Lett. 72, 3431 (1998).CrossRefGoogle Scholar
12.Budnar, M., Zorko, B., Pelicon, P., Spirkova-Hradilova, J., Kolarova-Nekvindova, P., and Turcicova, H., NIM B (Nuclear Instruments and Methods in Physics Research), 161–163, 568 (2000).CrossRefGoogle Scholar
13.Weis, R.S. and Gaylord, T.K., Appl. Phys. A 37, 191 (1985).CrossRefGoogle Scholar
14.Saarilahti, J. and Rauhala, E., NIM B (Nuclear Instruments and Methods in Physics Research) 64, 734 (1992).CrossRefGoogle Scholar
15.Kolarová, P., Hradilova, J., Novak, P., Schrofel, J., Vacik, J., and Ctyroky, J., PHOTONICS ’95 (Prague, August 23–25, 1995), European Optical Society Annual Meeting Digest Series: Vol. 2A, 1995, p. 190.Google Scholar
16.Vacik, J., Cervená, J., Hnatowicz, V., Havranek, V., and Fink, D., Acta Phys. Hungarica 75, 369 (1994).CrossRefGoogle Scholar
17.Kolarová, P., Vacik, J., Spirkova-Hradilova, J., and Cervena, J., NIM B (Nuclear Instruments and Methods in Physics Research) B 141, 498 (1998).CrossRefGoogle Scholar