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Electron backscatter diffraction analysis of Pb(Mg1/3Nb2/3)O3–35mol%PbTiO3 single crystals grown by seeded polycrystal conversion

Published online by Cambridge University Press:  26 November 2012

Ajmal Khan ,
Derrick T. Carpenter ,
Adam M. Scotch ,
Helen M. Chan  and
Martin P. Harmer
Ajmal Khan
Affiliation:
Materials Research Center, Lehigh University, Bethlehem, Pennsylvania 18015
Derrick T. Carpenter
Affiliation:
Materials Research Center, Lehigh University, Bethlehem, Pennsylvania 18015
Adam M. Scotch
Affiliation:
Materials Research Center, Lehigh University, Bethlehem, Pennsylvania 18015
Helen M. Chan
Affiliation:
Materials Research Center, Lehigh University, Bethlehem, Pennsylvania 18015
Martin P. Harmer
Affiliation:
Materials Research Center, Lehigh University, Bethlehem, Pennsylvania 18015
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Abstract

Electron backscatter diffraction (EBSD) has been applied to characterize Pb(Mg1/3Nb2/3)O3–35 mol%PbTiO3 single crystals grown by the seeded polycrystal conversion method. Macroscopically triangular crystal growth fronts were shown to each be associated with discrete crystals that originated from slightly misoriented segments of an initially cracked single-crystal seed plate. Various types of crystal imperfections, including voids, second-phase regions, and polycrystalline matrix grains trapped within the grown region, were readily identified and distinguished from one another using EBSD. Further, it was shown that trapped matrix grains in the grown region had consistently small misorientations with respect to the grown single crystal and this may be qualitatively explained by a simple boundary energetics argument. The significance of the trapped grains is discussed.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 3 , March 2001 , pp. 694 - 700
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1.Park, S-E. and Shrout, T.R., IEEE Trans. Ultrason., Ferroelectr., Freq. Control 44, 1140 (1997).CrossRefGoogle Scholar
2.Park, S-E. and Shrout, T.R., J. Appl. Phys. 82, 1804 (1997).CrossRefGoogle Scholar
3.Park, S-E. and Shrout, T.R., Mater. Res. Innovations 1, 20 (1997).CrossRefGoogle Scholar
4.Shrout, T.R., Chang, Z.P., Kim, N., and Markgraf, S., Ferroelectr. Lett. 12, 63 (1990).CrossRefGoogle Scholar
5.Harada, K., Shimanuki, S., Kobayashi, T., Saitoh, S., and Yamashita, Y., J. Am. Ceram. Soc. 81, 2785 (1998).CrossRefGoogle Scholar
6.Li, T., Scotch, A.M., Chan, H.M., Harmer, M.P., Park, S-E., Shrout, T.R., and Michael, J.R., J. Am. Ceram. Soc. 81, 244 (1998).CrossRefGoogle Scholar
7.Khan, A., Meschke, F.A., Li, T., Scotch, A.M., Chan, H.M., and Harmer, M.P., J. Am. Ceram. Soc. 82, 2958 (1999).CrossRefGoogle Scholar
8.Li, T., Wu, S., Khan, A., Scotch, A.M., Chan, H.M., and Harmer, M.P., J. Mater. Res. 14, 3189 (1999).CrossRefGoogle Scholar
9.Khan, A., Gorzkowski, E., Scotch, A.M., Leite, E.R., Li, T., Chan, H.M., and Harmer, M.P., J. Am. Ceram. Soc. (in preparation).Google Scholar
10.Kikuchi, S., Jpn. J. Phys. 5, 23 (1928).Google Scholar
11.Dingley, D.J. and Randle, V., J. Mater. Sci. 27, 4585 (1992).CrossRefGoogle Scholar
12.Scotch, A.M., Khan, A., Li, T., Chan, H.M., and Harmer, M.P., J. Am. Ceram. Soc. (in preparation).Google Scholar
13.Martin, J.W. and Doherty, R.D., Stability of Microstructure in Metallic Systems (Cambridge University Press, Cambridge, England, 1976), p. 131.Google Scholar
14.Humphreys, F.J. and Hatherly, M., Recrystallization and Related Annealing Phenomena (Pergamon, Oxford, England, 1995), Chapter 4, Sec. 4.2.Google Scholar
15.Engler, O. and Friedel, F., in Grain Growth in Polycrystalline Materials, Proceedings of the Third International Conference on Grain Growth (The Minerals, Metals and Materials Society, Warrendale, PA, 1998), pp. 277–282.Google Scholar
16.Humphreys, F.J. and Hatherly, M., Recrystallization and Related Annealing Phenomena (Pergamon, Oxford, England, 1995), Chap. 3, Secs. 3.3 and 3.4.Google Scholar
17.Martin, J.W. and Doherty, R.D., Stability of Microstructure in Metallic Systems (Cambridge University Press, Cambridge, England, 1976), p. 222.Google Scholar