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Application of the bond valence method to Si/NiSi2 interfaces

Published online by Cambridge University Press:  31 January 2011

M. O'Keeffe
M. O'Keeffe
Affiliation:
Department of Chemistry, Arizona State University, Tempe, Arizona 85287
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Abstract

It is shown how the bond valence method can be used to estimate expected interatomic distances in coherent interfaces. The method is illustrated by application to the Si/NiSi2 (111) interface with results generally in accord with experimental data.

Type
Articles
Information
Journal of Materials Research , Volume 6 , Issue 11 , November 1991 , pp. 2371 - 2374
Copyright
Copyright © Materials Research Society 1991

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