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Availability of periodically inspected systems subject to Markovian degradation

Published online by Cambridge University Press:  14 July 2016

Peter C. Kiessler*
Affiliation:
Clemson University
Georgia-Ann Klutke*
Affiliation:
Texas A&M University
Yoonjung Yang*
Affiliation:
Samsung Electronics Co. Ltd
*
Postal address: Department of Mathematical Sciences, Clemson University, Clemson, SC 29634-0975, USA.
∗∗ Postal address: Department of Industrial Engineering, Texas A&M University, College Station, TX 77843-3131, USA. Email address: [email protected]
∗∗∗ Postal address: SCM Group, Memory Division, Samsung Electronics Co. Ltd, San #16 Banwol-Ri, Taean-Eup, Hwasung City, Kyunggi 445-701, Republic of Korea.

Abstract

This paper studies inspected systems with non-self-announcing failures where the rate of deterioration is governed by a Markov chain. We compute the lifetime distribution and availability when the system is inspected according to a periodic inspection policy. In doing so, we expose the role of certain transient distributions of the environment.

Type
Research Papers
Copyright
Copyright © Applied Probability Trust 2002 

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