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Probe-corrected near-field to far-field transformation using multiple spherical wave expansions

Published online by Cambridge University Press:  27 February 2020

Fernando Rodríguez Varela Open the ORCID record for Fernando Rodríguez Varela [Opens in a new window] ,
Belén Galocha Iragüen  and
Manuel Sierra Castañer
Fernando Rodríguez Varela*
Affiliation:
Universidad Politécnica de Madrid, Av. Complutense no. 30, Madrid, Spain
Belén Galocha Iragüen
Affiliation:
Universidad Politécnica de Madrid, Av. Complutense no. 30, Madrid, Spain
Manuel Sierra Castañer
Affiliation:
Universidad Politécnica de Madrid, Av. Complutense no. 30, Madrid, Spain
*
Author for correspondence: Fernando Rodríguez Varela, E-mail: [email protected]
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Abstract

Near-field to far-field transformations constitute a powerful antenna characterization technique for near-field measurement scenarios. In this paper, a near-field to far-field transformation technique based on multiple spherical wave expansions (SWEs) is presented. Thanks to its iterative matrix inversion nature, the approach performs the transformation of fields measured on arbitrary surfaces. Also, irregular sampling schemes can be incorporated. The proposed algorithm is based on modeling the antenna fields with not one, but several SWEs distributed over its geometry. Due to the high number of SWEs, their truncation number can be arbitrarily reduced. Working with expansions of low order allows us to incorporate the probe correction in the transformation in a very simple way, accepting any type of probe and orientation. Only the probe far-field pattern is used, thus working with its full SWE is avoided. The algorithm is validated using simulated field data as well as measurements of real antennas.

Keywords

Antenna measurementsarbitrary surfacesnear-field to far-field transformationspherical wave expansion (SWE)
Type
Research Paper
Information
International Journal of Microwave and Wireless Technologies , Volume 12 , Special Issue 6: EuCAP 2019 Special Issue , July 2020 , pp. 447 - 454
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Copyright
Copyright © Cambridge University Press and the European Microwave Association 2020

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