Crossref Citations
This Book has been
cited by the following publications. This list is generated based on data provided by Crossref.
Guerrieri, Simona Donati
Ramella, Chiara
Bonani, Fabrizio
and
Ghione, Giovanni
2019.
Efficient Sensitivity and Variability Analysis of Nonlinear Microwave Stages Through Concurrent TCAD and EM Modeling.
IEEE Journal on Multiscale and Multiphysics Computational Techniques,
Vol. 4,
Issue. ,
p.
356.
Martin-Guerrero, Teresa M.
Santarelli, Alberto
Gibiino, Gian Piero
Traverso, Pier Andrea
Camacho-Penalosa, Carlos
and
Filicori, Fabio
2020.
Automatic Extraction of Measurement-Based Large-Signal FET Models by Nonlinear Function Sampling.
IEEE Transactions on Microwave Theory and Techniques,
Vol. 68,
Issue. 5,
p.
1627.
Guerrieri, S. Donati
Ramella, C.
Bonani, F.
and
Ghione, G.
2020.
PA design and statistical analysis through X-par driven load-pull and EM simulations.
p.
1.
Martin-Guerrero, Teresa M.
Santarelli, Alberto
Gibiino, Gian Piero
Traverso, Pier Andrea
Camacho-Penalosa, Carlos
and
Filicori, Fabio
2020.
Measurement-Based FET Analytical Modeling Using the Nonlinear Function Sampling Approach.
IEEE Microwave and Wireless Components Letters,
Vol. 30,
Issue. 12,
p.
1145.
Sahrling, Mikael
2021.
Analog Circuit Simulators for Integrated Circuit Designers.
p.
157.
Pedro, Jose
Gomes, Joao
and
Nunes, Luis
2021.
Electro-Thermal and Trapping Characterization of AlGaN/GaN RF Power HEMTs.
p.
1.
Sahrling, Mikael
2021.
Analog Circuit Simulators for Integrated Circuit Designers.
p.
329.
King, Justin B.
2021.
Efficientenergy‐conservativedispersive transistor modelling usingdiscrete‐timeconvolution and artificial neural networks.
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields,
Vol. 34,
Issue. 5,
Hart, Pascal A. lt
van Staveren, Job
Sebastiano, Fabio
Xu, Jianjun
Root, David E.
and
Babaie, Masoud
2021.
Artificial Neural Network Modelling for Cryo-CMOS Devices.
p.
1.
Sahrling, Mikael
2021.
Analog Circuit Simulators for Integrated Circuit Designers.
p.
5.
Singh, Dilbagh
Salter, Martin J.
Johny, Susan
and
Ridler, Nick M.
2022.
Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNA.
IEEE Instrumentation & Measurement Magazine,
Vol. 25,
Issue. 6,
p.
37.
M. Kast, Joshua
and
Elsherbeni, Atef Z.
2022.
Advances in Time‐Domain Computational Electromagnetic Methods.
p.
1.
Peng, Kaidong
Poore, Rick
Krantz, Philip
Root, David E.
and
O'Brien, Kevin P.
2022.
X-parameter based design and simulation of Josephson traveling-wave parametric amplifiers for quantum computing applications.
p.
331.
Gomes, Joao L.
Nunes, Luis C.
Barradas, Filipe M.
and
Pedro, Jose C.
2022.
A Qualitative Explanation of the AlGaN/GaN HEMT Nonlinear Intrinsic Capacitances.
p.
1.
Luo, Haorui
Yan, Xu
Zhang, Jingyuan
and
Guo, Yongxin
2022.
A Neural Network-Based Hybrid Physical Model for GaN HEMTs.
IEEE Transactions on Microwave Theory and Techniques,
Vol. 70,
Issue. 11,
p.
4816.
Martinez, Rafael Perez
Iwamoto, Masaya
Xu, Jianjun
Pahl, Philipp
and
Chowdhury, Srabanti
2023.
Benchmarking Measurement-Based Large-Signal FET Models for GaN HEMT Devices.
p.
69.
Tang, Xiaoqiang
Raffo, Antonio
Donato, Nicola
Crupi, Giovanni
and
Cai, Jialin
2023.
Theoretical and Experimental Analysis of a CSWPL Behavioral Model for Microwave GaN Transistors Including DC Bias Voltages.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,
p.
1.
Gomes, João L.
Barradas, Filipe M.
Nunes, Luís C.
and
Pedro, José C.
2023.
On the Energy Nonconservation in the FET’s Equivalent Circuit Capacitance Model.
IEEE Transactions on Electron Devices,
Vol. 70,
Issue. 9,
p.
4808.
Bisquert, Juan
2023.
Current-controlled memristors: Resistive switching systems with negative capacitance and inverted hysteresis.
Physical Review Applied,
Vol. 20,
Issue. 4,
Levochkina, A. Yu.
Ahmad, H. G.
Mastrovito, P.
Chatterjee, I.
Massarotti, D.
Montemurro, D.
Tafuri, F.
Pepe, G.P.
and
Esposito, M.
2024.
Numerical Simulations of Josephson Traveling Wave Parametric Amplifiers (JTWPAs): Comparative Study of Open-Source Tools.
IEEE Transactions on Applied Superconductivity,
Vol. 34,
Issue. 3,
p.
1.