Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2025-01-05T10:26:52.997Z Has data issue: false hasContentIssue false

10 - Noise figure characterization

from Part III - Linear measurements

Published online by Cambridge University Press:  05 June 2013

By
Nerea Otegi ,
Juan-Mari Collantes  and
Mohamed Sayed
Edited by
Valeria Teppati ,
Andrea Ferrero  and
Mohamed Sayed
Nerea Otegi
Affiliation:
University of the Basque Country (UPV/EHU)
Juan-Mari Collantes
Affiliation:
University of the Basque Country (UPV/EHU)
Mohamed Sayed
Affiliation:
Microwave and Millimeter Wave Solutions
Valeria Teppati
Affiliation:
Swiss Federal University (ETH), Zürich
Andrea Ferrero
Affiliation:
Politecnico di Torino
Mohamed Sayed
Affiliation:
Microwave and Millimeter Wave Solutions, Santa Rosa
Get access

Summary

Introduction

Noise is one of the most critical issues in wireless systems because it is a fundamental limiting factor for the performance of microwave receivers. Industry requirements for increasingly higher performing communication systems require tighter noise specifications that make the noise figure measurement a critical step in the characterization of modern microwave circuits and systems.

Noise figure measurements of circuits and sub-systems have been traditionally performed with noise figure meters specifically developed for that purpose. A paradigmatic example is the HP8970 (and associated family) that was considered for years as the reference meter for noise figure characterization. This instrument, as well as other modern equipment, uses the popular Y-factor technique to compute the noise figure from the ratio of two power measurements (“cold” and “hot”). The scalar nature of the measurements allows an easy and straightforward characterization process. This simplicity is undoubtedly part of its large success. However, its accuracy is limited by the match properties of the device under test and measurement setup.

There are two factors that have been driving an evolution in the noise figure characterization schemes. One factor is a growing tendency in microwave instrumentation to integrate different types of measurements into a single instrument box. As a result, noise figure characterization is now available as an option in modern vector network analyzers (VNA) from different manufacturers. The other factor is that the accuracy requirements in environments that are not perfectly matched (millimeter wave and beyond, on-wafer setups, etc.) demand a noise figure characterization that takes advantage of vector measurements to improve scalar results.

Type
Chapter
Information
Modern RF and Microwave Measurement Techniques , pp. 240 - 278
Publisher: Cambridge University Press
Print publication year: 2013

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] J. B., Johnson, “Thermal agitation of electricity in conductors,” Phys. Rev., vol. 32, pp. 97–109, July 1928.Google Scholar
[2] H., Nyquist, “Thermal agitation of electric charge in conductors,” Phys. Rev., vol. 32, pp. 110–113, July 1928.Google Scholar
[3] W. B., Davenport and W. L., Root, An Introduction to the Theory of Random Signals and Noise. New York: McGraw-Hill, 1958.Google Scholar
[4] A., Van der Ziel, Noise in Solid State Devices and Circuits. New York: Wiley-Interscience, 1986.Google Scholar
[5] A. B., Carlson, Communication Systems. An Introduction to Signals and Noise in Electrical Communication, 3rd ed. New York: McGraw Hill, 1986.Google Scholar
[6] S. A., Maas, Noise in Linear and Nonlinear Circuits. Norwood: Artech House Inc., 2005.Google Scholar
[7] D. M., Pozar, Microwave Engineering. New York: John Wiley and Sons, 1998.Google Scholar
[8] H. T., Friis, “Noise figure of radio receivers,” Proc. IRE, vol. 32, no. 7, pp. 419–422, July 1944.Google Scholar
[9] H. A., Haus and R. B., Adler, Circuit Theory of Linear Noisy Networks. New York: John Wiley and Sons, 1959.Google Scholar
[10] “IRE Standards on methods of measuring noise in Linear twoports, 1959,” Proc. IRE, vol. 48, no. 1, pp. 60–68, January 1960.
[11] “Description of the noise performance of amplifiers and receiving systems,” Proc. IEEE, vol. 51, no. 3, pp. 436–442, March 1963.
[12] IRE 7.S2, “IRE standards on electron tubes: Definition of terms, 1957,” Proc. IRE, vol. 45, no. 7, pp. 983–1010, July 1957.
[13] H., Rothe and W., Dahlke, “Theory of noisy fourpoles,” Proc. IRE, vol. 44, no. 6, pp. 811–818, June 1956.Google Scholar
[14] H. A., Haus et al. “Representation of noise in linear twoports,” Proc. IRE, vol. 48, no. 1, pp. 69–74, January 1960.Google Scholar
[15] P., Penfield, “Wave representation of amplifier noise,” IRE Trans. Circuit Theory, vol. 9, no.1, pp. 84–86, March 1962.Google Scholar
[16] K., Hartmann, “Noise characterization of linear circuits,” IEEE Trans. Circuits Syst., vol. 23, no. 10, October 1976.Google Scholar
[17] H., Fukui, “Available power gain, noise figure, and noise measure of two-ports and their graphical representations,” IEEE Trans. Circuit Theory, vol. 13, no. 2, pp. 137–142, June 1966.Google Scholar
[18] M. W., Pospieszalski, “Interpreting transistor noise,” IEEE Microwave Magazine, vol. 11, no. 6, pp. 61–69, October 2010.Google Scholar
[19] R. Q., Lane, “The determination of device noise parameters,” Proc. IEEE, vol. 57, no. 8, pp. 1461–1462, August 1969.Google Scholar
[20] M., Mitama and H., Katoh, “An improved computational method for noise parameter measurement,” IEEE Trans. Microw. Theory Tech., vol. 27, no. 6, pp. 612–615, June 1979.Google Scholar
[21] G., Vasilescu, G., Alquie, and M., Krim, “Exact computation of two-port noise parameters,” Electron. Lett., vol. 25, no. 4, pp. 292–293, February 1989.Google Scholar
[22] A., Boudiaf and M., Laporte, “An accurate and repeatable technique for noise parameter measurements,” IEEE Trans. Instrum. Meas., vol. 42, no. 2, pp. 532–537, April 1993.Google Scholar
[23] L., Escotte, R., Plana, and J., Graffeuil, “Evaluation of noise parameter extraction methods,” IEEE Trans. Microw. Theory Tech., vol. 41, no. 3, pp. 382–387, March 1993.Google Scholar
[24] V., Adamian and A., Uhlir, “A novel procedure for receiver noise characterization,” IEEE Trans. Instrum. Meas., vol. 22, no. 2, pp. 181–182, June 1973.Google Scholar
[25] A. C., Davidson, B. W., Leake, and E., Strid, “Accuracy improvements in microwave noise parameter measurements,” IEEE Trans. Microw. Theory Tech., vol. 37, no. 12, pp. 1973–1978, December 1989.Google Scholar
[26] R., Meierer and C., Tsironis, “An on-wafer noise parameter measurement technique with automatic receiver calibration,” Microwave Journal, vol. 38, pp. 22–37, March 1995.Google Scholar
[27] G., Caruso and M., Sannino, “Computer-aided determination of two-port noise parameters,” IEEE Trans. Microw. Theory Tech., vol. 26, no. 9, pp. 639–642, September 1978.Google Scholar
[28] J. M., O'Callaghan and J. P., Mondal, “A vector approach for noise parameter fitting and selection of source admittances,” IEEE Trans. Microw. Theory Tech., vol. 39, no. 8, pp. 1376–1382, August 1991.Google Scholar
[29] J. M., O'Callaghan, A., Alegret, L., Pradell, and I., Corbella, “Ill conditioning loci in noise parameter determination,” Electron. Lett., vol. 32, no. 18, pp. 1680–1681, August 1996.Google Scholar
[30] S., Van den Bosch and L., Martens, “Improved impedance pattern generation for automatic noise parameter determination,” IEEE Trans. Microw. Theory Tech., vol. 46, no. 11, pp. 1673–1678, November 1998.Google Scholar
[31] S. W., Wedge and D. B., Rutledge, “Wave techniques for noise modeling and measurement,” IEEE Trans. Microw. Theory Tech., vol. 40, no. 11, pp. 2004–2012, November 1992.Google Scholar
[32] J., Randa and D. K., Walker, “On-wafer measurement of transistor noise parameters at NIST,” IEEE Trans. Instrum. Meas., vol. 56, no. 2, pp. 551–554, April 2007.Google Scholar
[33] “Applications and operation of the 8970A noise figure meter,” Hewlett-Packard Product Note 8970A-1 (Agilent Manual 08970–99000), November 1981.
[34] “Agilent N8973A, N8974A, N8975A NFA series noise figure analyzers,” Agilent Data Sheet 5980–0164E, November 2007.
[35] “Agilent PSA series spectrum analyzers. Noise figure measurements personality,” Agilent Technical Overview 5988–7884EN, August 2005.
[36] “Application firmware for noise figure and gain measurements R&S®FS-K30 for R&S®FSP/FSU/FSQ,” Rohde & Schwarz FS-K30 Data Sheet, November 2003.
[37] “Fundamentals of RF and microwave noise figure measurements,” Agilent Application Note 57–1, October 2000.
[38] “Agilent 346A/B/C noise source,” Agilent Operating and Service Manual 00346–90139, July 2001.
[39] “Noise figure measurement accuracy — the Y-factor method,” Agilent Application Note 57–2, March 2004.
[40] “High-accuracy noise figure measurements using the PNA-X series network analyzer,” Agilent Application Note 1408–20, September 2010.
[41] “Noise figure measurements, VectorStar, making successful, con?dent NF measurements on amplifiers,” Anritsu Application Note 11410–00637, June 2012.
[42] N., Otegi, J. M., Collantes, and M., Sayed, “Receiver noise calibration for a vector network analyzer,” 76th Microwave Measurement Symposium (ARFTG), December 2010.Google Scholar
[43] “A new noise parameter measurement method results in more than 100x speed improvement and enhanced measurement accuracy,” Maury Microwave Application Note 5A–0.42, March 2009.
[44] “Noise figure measurement without a noise source on a vector network analyzer,” Rohde & Schwarz Application Note 1EZ61_2E, October 2010.
[45] BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, “Guide to the expression of uncertainty in measurement,” ISO, 1993, corrected and reprinted 1995.
[46] BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, “Guide to the expression of uncertainty in measurement. Supplement 1. Numerical methods for the propagation of distributions,” ISO, 2004.
[47] D., Boyd, “Calculate the uncertainty of NF measurements,” Microwaves & RF, pp. 93–102, October 1999.Google Scholar
[48] J., Randa, “Uncertainty analysis for noise-parameter measurements at NIST,” IEEE Trans. Instrum. Meas., vol. 58, no. 4, pp. 1146–1151, April 2009.Google Scholar
[49] A., Collado, J. M., Collantes, L., De la Fuente, N., Otegi, L., Perea, and M., Sayed, “Combined analysis of systematic and random uncertainties for different noise-figure characterization methodologies,” IEEE MTT-S Int. Microwave Symp. Dig., pp. 1419–1422, June 2003.Google Scholar
[50] N., Otegi, J. M., Collantes, and M., Sayed, “Uncertainty estimation in noise figure measurements at microwave frequencies,” AMUEM 2005, International Workshop on Advanced Methods for Uncertainty Estimation in Measurement, May 2005.Google Scholar
[51] “Noise figure corrections,” Anritsu Application Note 11410–00256, November 2000.
[52] “NF accuracy,” Anritsu Application Note 11410–00227, November 2003.
[53] “The Y factor technique for noise figure measurements,” Rohde & Schwarz Application Note 1MA178_0E, May 2011.
[54] Agilent Technologies, Noise Figure Uncertainty Calculator [Online], Available: http://www.agilent.com.
[55] Rohde & Schwarz, Noise Figure Error Estimation Tool [Online], Available: http://www2.rohde-schwarz.com.
[56] Anritsu, Noise Figure Uncertainty Calculator [Online], Available: http://www.anritsu.com.
[57] D., Vondran, “Noise figure measurement: Corrections related to match and gain,” Microwave Journal, vol. 42, pp. 22–38, March 1999.Google Scholar
[58] J. M., Collantes, R. D., Pollard, and M., Sayed, “Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques,” IEEE Trans. Instrum. Meas., vol. 51, no. 6, pp. 1150–1156, December 2002.Google Scholar
[59] G. F., Engen, “Mismatch considerations in evaluating amplifier noise performance,” IEEE Trans. Instrum. Meas., vol. 22, no. 3, pp. 274–278, September 1973.Google Scholar
[60] N. J., Khun, “Curing a subtle but significant cause of noise figure error,” Microwave Journal, vol. 27, no. 6, pp. 85–98, June 1984.Google Scholar
[61] L. F., Tiemeijer, R. J., Havens, R., de Kort, and A. J., Scholten, “Improved Y-factor method for wide-band on-wafer noise-parameter measurements,” IEEE Trans. Microw. Theory Tech., vol. 53, no. 9, pp. 2917–2925, September 2005.Google Scholar
[62] “Agilent N4000A, N4001A, N4002A SNS series noise sources 10 MHz to 26.5 GHz,” Agilent Product Overview 5988–0081EN, July 2005.
[63] E. W., Herold, “The operation of frequency converters and mixers for superheterodyne reception,” Proc. IRE, vol. 30, no. 2, pp. 84–103, February 1942.Google Scholar
[64] M. J. O., Strutt, “Noise-figure reduction in mixer stages,” Proc. IRE, vol. 34, no. 12, pp. 942–950, December 1946.Google Scholar
[65] H. C., Torrey and C. A., Whitmer, Crystal Rectifiers. McGraw-Hill: New York, 1948.Google Scholar
[66] W. L., Pritchard, “Notes on a crystal mixer performance,” IRE Trans. Microw. Theory Tech., vol. 3, no. 1, pp. 37–39, December 1955.Google Scholar
[67] G. C., Messenger and C. T., McCoy, “Theory and operation of crystal diodes as mixers,” Proc. IRE, vol. 45, no. 9, pp. 1269–1283, September 1957.Google Scholar
[68] R. D., Haun, “Summary of measurement techniques of parametric amplifier and mixer noise figure,” IRE Trans. Microw. Theory Tech., vol. 8, no. 4, pp. 410–415, July 1960.Google Scholar
[69] M. R., Barber, “Noise figure and conversion loss of the Schottky barrier mixer diode,” IEEE Trans. Microw. Theory Tech., vol. 15, no. 11, pp. 629–635, November 1967.Google Scholar
[70] D. N., Held and A. R., Kerr, “Conversion loss and noise of microwave and millimeter-wave mixers: Part 1 — theory,” IEEE Trans. Microw. Theory Tech., vol. 26, no. 2, pp. 49–55, February 1978.Google Scholar
[71] D. N., Held and A. R., Kerr, “Conversion loss and noise of microwave and millimeter-wave mixers: Part2–experiment,” IEEE Trans. Microw. Theory Tech., vol. 26, no. 2, pp. 55–61, February 1978.Google Scholar
[72] N., Otegi, N., Garmendia, J. M., Collantes, and M., Sayed, “SSB noise figure measurements of frequency translating devices,” IEEE MTT-S Int. Microwave Symp. Dig., pp. 1975–1978, June 2006.Google Scholar
[73] R., Poore, “Noise in ring topology mixers,” Agilent EEsof EDA, 2000.Google Scholar
[74] S. A., Maas, Microwave Mixers, 2nd ed., Norwood: Artech House, 1992.Google Scholar
[75] “Noise measurement software FS-K3. Noise test system with FSE, FSIQ, or FSP analyzers,” Rohde & Schwarz Application Note, News from Rohde-Schwarz 167, 2000/II.
[76] J., Dunsmore, “Novel method for vector mixer characterization and mixer test system vector error correction,” IEEE MTT-S Int. Microwave Symp. Dig., vol. 3, pp. 1833–1836, June 2002.Google Scholar
[77] G. M., Hegazi, A., Jelenski, and K. S., Yngvesson, “Limitations of microwave and millimeter-wave mixers due to excess noise,” IEEE Trans. Microw. Theory Tech., vol. 33, no. 12, pp. 1404–1409, December 1985.Google Scholar

Save book to Kindle

To save this book to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Available formats
×

Save book to Dropbox

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

Available formats
×