Book contents
- Frontmatter
- Contents
- Preface
- List of contributors
- List of abbreviations
- Part I General concepts
- Part II Microwave instrumentation
- 3 Microwave synthesizers
- 4 Real-time spectrum analysis and time-correlated measurements applied to nonlinear system characterization
- 5 Vector network analyzers
- 6 Microwave power measurements
- 7 Modular systems for RF and microwave measurements
- Part III Linear measurements
- Part IV Nonlinear measurements
- Index
- References
7 - Modular systems for RF and microwave measurements
from Part II - Microwave instrumentation
Published online by Cambridge University Press: 05 June 2013
- Frontmatter
- Contents
- Preface
- List of contributors
- List of abbreviations
- Part I General concepts
- Part II Microwave instrumentation
- 3 Microwave synthesizers
- 4 Real-time spectrum analysis and time-correlated measurements applied to nonlinear system characterization
- 5 Vector network analyzers
- 6 Microwave power measurements
- 7 Modular systems for RF and microwave measurements
- Part III Linear measurements
- Part IV Nonlinear measurements
- Index
- References
Summary
Introduction
One of the major progressions in RF, microwave, and wireless testing is the ability to make fast, flexible, and accurate measurements using software-designed, modular instruments. As RF applications have become increasingly more complex and challenging, legacy test, validation, and design systems, which are generally expensive and rigid, have become increasingly less competitive, and are being replaced by modular, software-designed instruments that are more flexible, extensible, and designed to keep up with the rapid pace of change in the RF and wireless industry. There has been an inflection point in the industry, and the momentum behind software-designed modular instruments is expected to continue accelerating.
Combining Moore's Law with advances in RF technologies and processes has enabled the development of smaller form-factor, lower-cost modular products to match the performance and features of more traditional test products. Modular systems can take full advantage of multi-core processors and make use of the latest FPGA technologies to allow for the greatest measurement flexibility and timing control. These advances have resulted in measurement devices whose core functionality is designed, at least partially, by software written by the system designer(s). Software-designed instruments are mainstream in today's test systems. They allow scientists and engineers to use software to specify pass/fail criteria, test execution flow, signal processing and mathematics, data/logging, and other required elements of test and measurement systems. Software-designed instruments may have vendor-defined elements as part of the system, but unlike purely vendor-defined solutions, software-designed instruments empower engineers with the ability to design their test systems and instruments specifically for their needs.
- Type
- Chapter
- Information
- Modern RF and Microwave Measurement Techniques , pp. 160 - 192Publisher: Cambridge University PressPrint publication year: 2013