Book contents
- Electronic Sensor Design Principles
- Electronic Sensor Design Principles
- Copyright page
- Dedication
- Contents
- Preface
- Part I Fundamentals
- Part II Noise and Electronic Interfaces
- 6 The Origin of Noise
- 7 Noise in Electronic Devices and Circuits
- 8 Detection Techniques
- Part III Selected Topics on Physics of Transduction
- Part IV Problems and Solutions
- Index
- References
8 - Detection Techniques
from Part II - Noise and Electronic Interfaces
Published online by Cambridge University Press: 23 December 2021
Book contents
- Electronic Sensor Design Principles
- Electronic Sensor Design Principles
- Copyright page
- Dedication
- Contents
- Preface
- Part I Fundamentals
- Part II Noise and Electronic Interfaces
- 6 The Origin of Noise
- 7 Noise in Electronic Devices and Circuits
- 8 Detection Techniques
- Part III Selected Topics on Physics of Transduction
- Part IV Problems and Solutions
- Index
- References
Summary
The noise performance and the main characteristics of electronics devices and elementary building blocks have been discussed in earlier chapters. Here, more complex techniques for sensing interfaces are presented. Architectures tailored for specific cases such as resistive and capacitive sensing are analyzed. Furthermore, modulation, feedback, and time-to-digital techniques for signal detection are shown.
Keywords
- Type
- Chapter
- Information
- Electronic Sensor Design Principles , pp. 374 - 422Publisher: Cambridge University PressPrint publication year: 2022
References
Further Reading
Abidi, A. A. and Meyer, R. G., Noise in relaxation oscillators, IEEE J. Solid-State Circuits, vol. 18, pp. 794–802, 1983.CrossRefGoogle Scholar
Barbe, D. F., Imaging devices using the charge-coupled concept, Proc. IEEE, vol. 63, no. 1, pp. 38–67, 1975.Google Scholar
Danneels, H., Coddens, K., and Gielen, G. A fully-digital, 0.3 V, 270 nW capacitive sensor interface without external references, in 2011 Proceedings of the ESSCIRC (ESSCIRC), 2011, pp. 287–290.CrossRefGoogle Scholar
Enz, C. C. and Temes, G. C., Circuit techniques for reducing the effects of opamp imperfections: Autozeroing, correlated double sampling, and chopper stabilization, Proc. IEEE, vol. 84, no. 11, pp. 1584–1614, 1996.Google Scholar
Jang, T., Jeong, S., Jeon, D., Choo, K. D., Sylvester, D., and Blaauw, D., A noise reconfigurable all-digital phase-locked loop using a switched capacitor-based frequency-locked loop and a noise detector, IEEE J. Solid-State Circuits, vol. 53, no. 1, pp. 50–65, 2018.CrossRefGoogle Scholar
Navid, R. Lee, T. H., and Dutton, R. W., Minimum achievable phase noise of RC oscillators, IEEE J. Solid-State Circuits, vol. 40, no. 3, pp. 630–637, March 2005.Google Scholar
Nutt, R., Digital time intervalometer, Rev. Sci. Instrum., vol. 39, no. 9, pp. 1342–1345, Sept. 1968.CrossRefGoogle Scholar
Pallas-Areny, R. and Webster, J., Sensors and Signal Conditioning. Hoboken, NJ: John Wiley & Sons, 2001.Google Scholar
Park, M. and Perrott, M. H., A 78 dB SNDR 87 mW 20 MHz bandwidth continuous-time delta-sigma ADC with VCO-based integrator and quantizer implemented in 0.13 μm CMOS, IEEE J. Solid-State Circuits, vol. 44, no. 12, pp. 3344–3358, Dec. 2009.Google Scholar
Schreier, R. and Temes, G. C., Understanding Delta-Sigma Data Converters. New York: IEEE Press, 2005.Google Scholar
Straayer, M. Z. and Perrott, M. H., A 12-bit, 10-MHz bandwidth, continuous-time sigma-delta ADC with a 5-bit, 950-MS/s VCO-based quantizer, IEEE J. Solid-State Circuits, vol. 43, no. 4, pp. 805–814, 2008.CrossRefGoogle Scholar