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22 - Consistent inference on inconsistent data

from PART V - REAL-WORLD APPLICATIONS

Published online by Cambridge University Press:  05 July 2014

Wolfgang von der Linden
Affiliation:
Technische Universität Graz, Austria
Volker Dose
Affiliation:
Max-Planck-Institut für Plasmaphysik, Garching, Germany
Udo von Toussaint
Affiliation:
Max-Planck-Institut für Plasmaphysik, Garching, Germany
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Summary

It is common experience of all experimental scientists that repeated measurements of supposedly one and the same quantity result occasionally in data which are in striking disagreement with all others. Such data are usually called outliers. There are numerous conceivable reasons for such outliers. Formally we may consider the sequence of measurements dj with confidence limits dj ± σj. If the distance ∣djdk∣ of any two data points dj and dk becomes larger than the sum (σ2k + σ2j)1/2 of the associated errors, then the data start to become inconsistent and finally at least one of them will become an outlier. There are no strict meanings to the terms ‘inconsistent’ and ‘outliers’ and it is exactly this lack of uniqueness in the definition which enforces a treatment by probability theory. We shall consider two different cases. Inconsistency of the data may result from a wrong estimate of the measurement error σk. Already Carl Friedrich Gauss was concerned about measurement uncertainties and stated that ‘the variances of the measurements are practically never known exactly’ [81]. Inconsistency may also arise from measurements distorted by signals from some unrecognized spurious source, leading to ‘strong’ deviations of dk from the mainstream. We shall begin with the first case.

Erroneously measured uncertainties

In the preceding sections we have boldly assumed that the standard deviation σi of the error distribution for the measured quantity di is known exactly. This assumption almost never applies.

Type
Chapter
Information
Bayesian Probability Theory
Applications in the Physical Sciences
, pp. 364 - 395
Publisher: Cambridge University Press
Print publication year: 2014

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