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Quantification of stacking disordered Si–Al layer silicates by the Rietveld method: application to exploration for high-sulphidation epithermal gold deposits
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- Journal:
- Powder Diffraction / Volume 30 / Issue S1 / June 2015
- Published online by Cambridge University Press:
- 22 April 2015, pp. S111-S118
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- Article
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