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Contamination of TEM Holders Quantified and Mitigated With the Open-Hardware, High-Vacuum Bakeout System
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 5 / October 2020
- Published online by Cambridge University Press:
- 14 July 2020, pp. 906-912
- Print publication:
- October 2020
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- Article
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