17 results
Interfacial Strain Mapping and Chemical Analysis of Strained-Interface Heterostructures by Nanodiffraction and Electron Energy-Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1776-1777
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- July 2017
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Correlated Electron Microscopy across Length Scales to Elucidate Structural, Electrical and Chemical Properties of Oxide Grain Boundaries
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 334-335
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- July 2017
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Nanoscale Strain and Composition Mapping in Ionic Thin Film Heterostructures for Resistive Switching Devices
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 518-519
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- July 2016
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In Situ TEM Straining of Ultrafine-grained Aluminum Films of Different Textures Using Automated Crystal Orientation Mapping.
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 1950-1951
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- July 2016
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Grain Boundaries across Length Scales; Correlating SEM, Aberration-Corrected TEM Orientation Imaging and Nanospectroscopy
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 491-492
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- August 2015
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Precession Electron Diffraction Detection and Phase Mapping of Retained Austenite and Carbides in a Heat Treated Low Alloy Carbon Steel Using a JEOL ARM 200 TEM with an AppFive Topspin System for Synchronized Beam Scanning and Precession
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 876-877
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- August 2014
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Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 1066-1067
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- August 2014
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Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 702-703
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- August 2013
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Grain Boundary Character Distribution of Nanocrystalline Cu Thin Films Using Stereological Analysis of Transmission Electron Microscope Orientation Maps
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- Microscopy and Microanalysis / Volume 19 / Issue 1 / February 2013
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- 04 February 2013, pp. 111-119
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- February 2013
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Nanoscale Automated Phase and Orientation Mapping in the TEM
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- Microscopy Today / Volume 20 / Issue 6 / November 2012
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- 02 November 2012, pp. 38-42
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- November 2012
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Precession-Assisted Nanoscale Phase and Crystal Orientation Mapping of Cu-Nb Composites in the Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1426-1427
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- July 2012
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Grain Boundary Characterization of Nanocrystalline Cu from the Stereological Analysis of Transmission Electron Microscope Orientation Maps
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1416-1417
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- July 2011
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Characterizing Texture and Grain Boundaries in Nanoscale Cu Interconnects by Precession Electron Diffraction
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1346-1347
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- July 2011
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Automated Crystal Orientation and Phase Mapping for Thin Film Applications by Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1086-1087
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- July 2011
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Grain Boundary Characterization of Nanocrystalline Cu from the Stereological Analysis of Transmission Electron Microscope Orientation Maps
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1426-1427
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- July 2011
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Grain Size Determination and Grain Boundary Characterization of Nanocrystalline Thin Films from Conical Dark Field Imaging
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1276-1277
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- July 2010
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Orientation Imaging of Nanocrystalline Platinum Films in the TEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1232-1233
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- July 2009
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