Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Kumar, Vineet
2011.
Automated Grain Mapping Using Wide Angle Convergent Beam Electron Diffraction in Transmission Electron Microscope for Nanomaterials.
Microscopy and Microanalysis,
Vol. 17,
Issue. 6,
p.
859.
Kobler, A.
Kashiwar, A.
Hahn, H.
and
Kübel, C.
2013.
Combination of in situ straining and ACOM TEM: A novel method for analysis of plastic deformation of nanocrystalline metals.
Ultramicroscopy,
Vol. 128,
Issue. ,
p.
68.
Kumar, V.
2013.
Orientation Imaging Microscopy With Optimized Convergence Angle Using CBED Patterns in TEMs.
IEEE Transactions on Image Processing,
Vol. 22,
Issue. 7,
p.
2637.
Rollett, Anthony D.
and
Barmak, Katayun
2014.
Physical Metallurgy.
p.
1113.