Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-04T21:01:25.312Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlated Electron Microscopy across Length Scales to Elucidate Structural, Electrical and Chemical Properties of Oxide Grain Boundaries

Published online by Cambridge University Press:  04 August 2017

William J. Bowman ,
Madeleine N. Kelly ,
Gregory S. Rohrer ,
Cruz A. Hernandez ,
Amith Darbal  and
Peter A. Crozier
William J. Bowman
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA Laboratory for Electrochemical Interfaces, MIT, Cambridge, MA, US
Madeleine N. Kelly
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA, USA
Gregory S. Rohrer
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA, USA
Cruz A. Hernandez
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA
Amith Darbal
Affiliation:
AppFive LLC, Tempe, AZ, USA
Peter A. Crozier
Affiliation:
School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 334 - 335
Copyright
© Microscopy Society of America 2017 

References

[1] Guo, X. & Waser, R. Prog. Mater. Sci 51 2006 151–206.CrossRefGoogle Scholar
[2] Jasper, A., Kilner, J.A. & McComb, D.W. Solid State Ion 179 2008 904–908.CrossRefGoogle Scholar
[3] Bowman, W.J., Kelly, M.N., Rohrer, G.S., Hernandez, C.A. & Crozier, P.A. (In review).Google Scholar
[4] Bowman, W.J., Darbal, A. & Crozier, P.A. (In preparation).Google Scholar
[5] W.J.B. acknowledges the NSF’s Graduate Research Fellowship (DGE-1211230) for financial support. M.N.K. and G.S.R. acknowledge support from the ONR-MURI program (grant no. N00014-11 -0678). C.A.H. acknowledges ASU’s Fulton Undergraduate Research Initiative for financial support. P.A.C. and W.J.B. acknowledge support of NSF grant DMR-1308085. The authors acknowledge access to ASU’s John M. Cowley Center for High Resolution Electron Microscopy..Google Scholar