Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Liu, Xuan
Choi, Dooho
Beladi, Hossein
Nuhfer, Noel T.
Rohrer, Gregory S.
and
Barmak, Katayun
2013.
The five-parameter grain boundary character distribution of nanocrystalline tungsten.
Scripta Materialia,
Vol. 69,
Issue. 5,
p.
413.
VILADOT, D.
VÉRON, M.
GEMMI, M.
PEIRÓ, F.
PORTILLO, J.
ESTRADÉ, S.
MENDOZA, J.
LLORCA‐ISERN, N.
and
NICOLOPOULOS, S.
2013.
Orientation and phase mapping in the transmission electron microscope using precession‐assisted diffraction spot recognition: state‐of‐the‐art results.
Journal of Microscopy,
Vol. 252,
Issue. 1,
p.
23.
Ruiz‐Zepeda, Francisco
Casallas‐Moreno, Yenny L.
Cantu‐Valle, Jesus
Alducin, Diego
Santiago, Ulises
José‐Yacaman, Miguel
López‐López, Máximo
and
Ponce, Arturo
2014.
Precession electron diffraction‐assisted crystal phase mapping of metastable c‐GaN films grown on (001) GaAs.
Microscopy Research and Technique,
Vol. 77,
Issue. 12,
p.
980.
Liu, Y.
Samimi, P.
Ghamarian, I.
Brice, D. A.
Huber, D. E.
Wang, Z.
Dixit, V.
Koduri, S.
Fraser, H. L.
and
Collins, P. C.
2015.
Discovery via Integration of Experimentation and Modeling: Three Examples for Titanium Alloys.
JOM,
Vol. 67,
Issue. 1,
p.
164.
Ruiz-Zepeda, Francisco
Arizpe-Zapata, J. Alejandro
Bahena, Daniel
Ponce, Arturo
and
Garcia-Gutierrez, Domingo I.
2015.
Advanced Transmission Electron Microscopy.
p.
31.
Rohrer, Gregory S.
Liu, Xuan
Liu, Jiaxing
Darbal, Amith
Kelly, Madeleine N.
Chen, Xiwen
Berkson, Michael A.
Nuhfer, Noel T.
Coffey, Kevin R.
and
Barmak, Katayun
2017.
The grain boundary character distribution of highly twinned nanocrystalline thin film aluminum compared to bulk microcrystalline aluminum.
Journal of Materials Science,
Vol. 52,
Issue. 16,
p.
9819.
Bertin, Eugène
Gautron, Éric
Barreau, Nicolas
Cornet, Charles
Arzel, Ludovic
Choubrac, Léo
Létoublon, Antoine
Harel, Sylvie
Bernard, Rozenn
Jullien, Maud
and
Durand, Olivier
2024.
Evidence of Cationic Antiphase Disorder in Epitaxial Cu(In,Ga)S2 Grown on GaP/Si(001).
physica status solidi (RRL) – Rapid Research Letters,
Vol. 18,
Issue. 6,