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Pattern formation during electrochemical and liquid metal dealloying

Published online by Cambridge University Press:  10 January 2018

Ian McCue ,
Alain Karma  and
Jonah Erlebacher
Ian McCue
Affiliation:
Texas A&M University, USA; [email protected]
Alain Karma
Affiliation:
Northeastern University, USA; [email protected]
Jonah Erlebacher
Affiliation:
Department of Materials Science and Engineering, Johns Hopkins University, USA; [email protected]
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Abstract

Dealloying has evolved from a problematic corrosion process to a versatile tool for scalable fabrication of nanostructured metals. While the original, and majority of, work in the area has focused on electrochemical dealloying, a powerful variation of dealloying—liquid metal dealloying—has recently gained popularity. This process relies on a melt to carry out selective dissolution, replacing the traditional electrolyte solution. While electrolytes and molten metals are both suitable dealloying media, they can lead to very different morphologies. In this article, we compare and contrast what is known about the microscale physics and chemistry controlling microstructural evolution in electrochemical and liquid metal dealloying. We conclude that the core phenomenology of porosity evolution—a competition between dissolution and interface diffusion—is similar in both dealloying processes, but that the relative magnitudes of these two processes control interfacial pattern formation.

Keywords

nanostructurediffusionmorphologyself-assembly
Type
Dealloyed Nanoporous Materials with Interface-Controlled Behavior
Information
MRS Bulletin , Volume 43 , Issue 1: Dealloyed Nanoporous Materials with Interface-Controlled Behavior , January 2018 , pp. 27 - 34
Copyright
Copyright © Materials Research Society 2018 

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References

Erlebacher, J., Seshadri, R., MRS Bull. 34, 561 (2009).CrossRefGoogle Scholar
McCue, I., Benn, E., Gaskey, B., Erlebacher, J., Annu. Rev. Mater. Res. 46, 263 (2016).CrossRefGoogle Scholar
Erlebacher, J., Sieradzki, K., Scr. Mater. 49, 991 (2003).CrossRefGoogle Scholar
Erlebacher, J., J. Electrochem. Soc. 151, C614 (2004).CrossRefGoogle Scholar
Erlebacher, J., Aziz, M.J., Karma, A., Dimitrov, N., Sieradzki, K., Nature 410, 450 (2001).CrossRefGoogle Scholar
Sieradzki, K., J. Electrochem. Soc. 140, 2868 (1993).CrossRefGoogle Scholar
Wada, T., Yubuta, K., Inoue, A., Kato, H., Mater. Lett. 65, 1076 (2011).CrossRefGoogle Scholar
McCue, I., Gaskey, B., Geslin, P.-A., Karma, A., Erlebacher, J., Acta Mater. 115, 10 (2016).CrossRefGoogle Scholar
Geslin, P., McCue, I., Gaskey, B., Erlebacher, J., Karma, A., Nat. Commun. 6, 8887 (2015).CrossRefGoogle Scholar
Zhang, X., Ding, Y., Catal. Sci. Technol. 3, 2862 (2013).CrossRefGoogle Scholar
Ding, Y., Chen, M., MRS Bull. 34, 569 (2009).CrossRefGoogle Scholar
Ding, Y., Kim, Y.J., Erlebacher, J., Adv. Mater. 16, 1897 (2004).CrossRefGoogle Scholar
Snyder, J., Fujita, T., Chen, M.W., Erlebacher, J., Nat. Mater. 9, 904 (2010).CrossRefGoogle Scholar
Fujita, T., Guan, P., McKenna, K., Lang, X., Hirata, A., Zhang, L., Tokunaga, T., Arai, S., Yamamoto, Y., Tanaka, N., Ishikawa, Y., Asao, N., Yamamoto, Y., Erlebacher, J., Chen, M., Nat. Mater. 11, 775 (2012).CrossRefGoogle Scholar
Biener, J., Wittstock, A., Zepeda-Ruiz, L.A., Biener, M.M., Zielasek, V., Kramer, D., Viswanath, R.N., Weissmüller, J., Bäumer, M., Hamza, V., Nat. Mater. 8, 47 (2009).CrossRefGoogle Scholar
Chen, L.Y., Yu, J.S., Fujita, T., Chen, M.W., Adv. Funct. Mater. 19, 1221 (2009).CrossRefGoogle Scholar
Bringa, E.M., Monk, J.D., Caro, A., Misra, A., Zepeda-Ruiz, L., Duchaineau, M., Abraham, F., Nastasi, M., Picraux, S.T., Wang, Y.Q., Farkas, D., Nano Lett. 12, 3351 (2012).CrossRefGoogle Scholar
Farkas, D., Caro, A., Bringa, E., Crowson, D., Acta Mater. 61, 3249 (2013).CrossRefGoogle Scholar
Briot, N.J., Balk, T.J., Philos. Mag. 95, 2955 (2015).CrossRefGoogle Scholar
Briot, N.J., Kennerknecht, T., Eberl, C., Balk, T.J., Philos. Mag. 94, 847 (2014).CrossRefGoogle Scholar
Badwe, N., Chen, X., Sieradzki, K., Acta Mater. 129, 251 (2017).CrossRefGoogle Scholar
Biener, M.M., Biener, J., Wichmann, A., Wittstock, A., Baumann, T.F., Bäumer, M., Hamza, A.V., Nano Lett. 11, 3085 (2011).CrossRefGoogle Scholar
Biener, M.M., Ye, J., Baumann, T.F., Wang, Y.M., Shin, S.J., Biener, J., Hamza, A.V., Adv. Mater. 26, 4808 (2014).CrossRefGoogle Scholar
Wittstock, A., Zielasek, V., Biener, J., Friend, C.M., Baumer, M., Science 327, 319 (2010).CrossRefGoogle Scholar
Ito, Y., Tanabe, Y., Han, J., Fujita, T., Tanigaki, K., Chen, M., Adv. Mater. 27, 4302 (2015).CrossRefGoogle Scholar
Fujita, T., Okada, H., Koyama, K., Watanabe, K., Maekawa, S., Chen, M.W., Phys. Rev. Lett. 101, 166601 (2008).CrossRefGoogle Scholar
Sun, S., Chen, X., Badwe, N., Sieradzki, K., Nat. Mater. 14, 894 (2015).CrossRefGoogle Scholar
Wada, T., Setyawan, A.D., Yubuta, K., Kato, H., Scr. Mater. 65, 532 (2011).CrossRefGoogle Scholar
Harrison, J., Wagner, C., Acta Metall. 7, 722 (1959).CrossRefGoogle Scholar
McCue, I., Ryan, S., Hemker, K., Xu, X., Li, N., Chen, M., Erlebacher, J., Adv. Eng. Mater. 18, 46 (2016).CrossRefGoogle Scholar
Wada, T., Ichitsubo, T., Yubuta, K., Segawa, H., Yoshida, H., Kato, H., Nano Lett. 14, 4505 (2014).CrossRefGoogle Scholar
Kim, M.-S., Nishikawa, H., J. Mater. Sci. 48, 5645 (2013).CrossRefGoogle Scholar
Zeis, R., Lei, T., Sieradzki, K., Snyder, J., Erlebacher, J., J. Catal. 253, 132 (2008).CrossRefGoogle Scholar
Rugolo, J., Erlebacher, J., Sieradzki, K., Nat. Mater. 5, 946 (2006).CrossRefGoogle Scholar
Fujita, T., Qian, L.H., Inoke, K., Erlebacher, J., Chen, M.W., Appl. Phys. Lett. 92, 90 (2008).CrossRefGoogle Scholar
Ye, X.-L., Lu, N., Li, X.-J., Du, K., Tan, J., Jin, H.-J., J. Electrochem. Soc. 161, C517 (2014).CrossRefGoogle Scholar
Vega, A.A., Newman, R.C., J. Electrochem. Soc. 161, C1 (2014).CrossRefGoogle Scholar
Dona, J.M., Gonzalez-Velasco, J., J. Phys. Chem. 97, 4714 (1993).CrossRefGoogle Scholar
González Velasco, J., Surf. Sci. 410, 283 (1998).CrossRefGoogle Scholar
Chen-Wiegart, Y.C.K., Wang, S., Lee, W.K., McNulty, I., Voorhees, P.W., Dunand, D.C., Acta Mater. 61, 1118 (2013).CrossRefGoogle Scholar
Chen-Wiegart, Y.C.K., Wang, S., McNulty, I., Dunand, D.C., Acta Mater. 61, 5561 (2013).CrossRefGoogle Scholar
Snyder, J., Erlebacher, J., J. Electrochem. Soc. 157, C125 (2010).CrossRefGoogle Scholar
Tai, M., Gentle, A., de Silva, K., Arnold, M., Lingen, E., Cortie, M., Metals (Basel) 5, 1197 (2015).CrossRefGoogle Scholar
Supansomboon, S., Porkovich, A., Dowd, A., Arnold, M.D., Cortie, M.B., ACS Appl. Mater. Interfaces 6, 9411 (2014).CrossRefGoogle Scholar
Volkert, C.A., Lilleodden, E.T., Kramer, D., Weissmüller, J., Appl. Phys. Lett. 89, 61920 (2006).CrossRefGoogle Scholar
Chen, Q., Sieradzki, K., Nat. Mater. 12, 1102 (2013).CrossRefGoogle Scholar
Stuckner, J., Frei, K., McCue, I., Demkowicz, M.J., Murayama, M., Comput. Mater. Sci. 139, 320 (2017).CrossRefGoogle Scholar
El Mel, A.-A., Boukli-Hacene, F., Molina-Luna, L., Bouts, N., Chauvin, A., Thiry, D., Gautron, E., Gautier, N., Tessier, P.-Y., ACS Appl. Mater. Interfaces 7, 2310 (2015).CrossRefGoogle Scholar
Wada, T., Kato, H., Scr. Mater. 68, 723 (2013).CrossRefGoogle Scholar
Liu, W., Zhang, S., Li, N., Zheng, J., An, S., Li, G., Int. J. Electrochem. Sci. 7, 7793 (2012).Google Scholar
Wang, L., Balk, T.J., Metall. Mater. Trans. A 45, 1096 (2014).CrossRefGoogle Scholar
Kim, J.W., Wada, T., Kim, S.G., Kato, H., Mater. Lett. 116, 223 (2014).CrossRefGoogle Scholar
Wang, L., Balk, T.J., Philos. Mag. Lett. 94, 573 (2014).CrossRefGoogle Scholar
Li, W.-C., Balk, T.J., Materials (Basel) 2, 2496 (2009).CrossRefGoogle Scholar
Snyder, J., McCue, I., Livi, K., Erlebacher, J., J. Am. Chem. Soc. 134 (20), 8633 (2012).CrossRefGoogle Scholar
Hakamada, M., Motomura, J., Hirashima, F., Mabuchi, M., Mater. Trans. 53, 524 (2012).CrossRefGoogle Scholar
Dixon, M.C., Daniel, T.A., Hieda, M., Smilgies, D.M., Chan, M.H.W., Allara, D.L., Langmuir 23, 2414 (2007).CrossRefGoogle Scholar
Flynn, C.P., J. Phys. Condens. Matter 18, S439 (2006).CrossRefGoogle Scholar
Kertis, F., Snyder, J., Govada, L., Khurshid, S., Chayen, N., Erlebacher, J., JOM 62, 50 (2010).CrossRefGoogle Scholar
Chen-Wiegart, Y.C.K., Wang, S., Chu, Y.S., Liu, W., McNulty, I., Voorhees, P.W., Dunand, D.C., Acta Mater. 60, 4972 (2012).CrossRefGoogle Scholar
Qi, Z., Weissmüller, J., ACS Nano 7, 5948 (2013).CrossRefGoogle Scholar
Sun, Y., Balk, T.J., Scr. Mater. 58, 727 (2008).CrossRefGoogle Scholar
Park, C.-L., Voorhees, P.W., Thornton, K., Acta Mater. 90, 182 (2015).CrossRefGoogle Scholar
Erlebacher, J., Phys. Rev. Lett. 106, 225504 (2011).CrossRefGoogle Scholar
Parida, S., Kramer, D., Volkert, C.A., Rosner, H., Erlebacher, J., Weissmueller, J., Phys. Rev. Lett. 97, 035504 (2006).CrossRefGoogle Scholar
Erlebacher, J., McCue, I., Acta Mater. 60, 6164 (2012).CrossRefGoogle Scholar
Artymowicz, D.M., Sieradzki, K., Newman, R.C., ECS Trans. 53, 15 (2013).CrossRefGoogle Scholar
Policastro, S.A., Carnahan, J.C., Zangari, G., Bart-Smith, H., Seker, E., Begley, M.R., Reed, M.L., Reynolds, P.F., Kelly, R.G., J. Electrochem. Soc. 157, C328 (2010).CrossRefGoogle Scholar
Newman, R., Corcoran, S., Erlebacher, J., Aziz, M.J., Sieradzki, K., MRS Bull. 24, 24 (1999).CrossRefGoogle Scholar
Sieradzki, K., Corderman, R.R., Shukla, K., Newman, R.C., Philos. Mag. 59, 713 (1989).CrossRefGoogle Scholar
Artymowicz, D.M., Erlebacher, J., Newman, R.C., Philos. Mag. 89, 1663 (2009).CrossRefGoogle Scholar
Eilks, C., Elliott, C.M., J. Comput. Phys. 227, 9727 (2008).CrossRefGoogle Scholar
Guyer, J., Boettinger, W., Warren, J., McFadden, G., Phys. Rev. E 69, 021603 (2004).CrossRefGoogle Scholar
Guyer, J., Boettinger, W., Warren, J., McFadden, G., Phys. Rev. E 69, 021604 (2004).CrossRefGoogle Scholar
Boettinger, W., Warren, J., Beckermann, C., Karma, A., Annu. Rev. Mater. Res. 32, 163 (2002).CrossRefGoogle Scholar
Kobayashi, H., Ode, M., Gyoon Kim, S., Tae Kim, W., Suzuki, T., Scr. Mater. 48, 689 (2003).CrossRefGoogle Scholar
Nestler, B., Garcke, H., Stinner, B., Phys. Rev. E 71, 041609 (2005).CrossRefGoogle Scholar
Steinbach, I., Model. Simul. Mater. Sci. Eng. 17, 073001 (2009).CrossRefGoogle Scholar
Jackson, K., Hunt, J., Trans. Metall. Soc. AIME 236, 1129 (1966).Google Scholar
Dantzig, J., Rappaz, M., Solidification (EPFL Press, Lausanne, Switzerland, 2009).CrossRefGoogle Scholar
Chen, Q., Sieradzki, K., J. Electrochem. Soc. 160, C226 (2013).CrossRefGoogle Scholar