Research Article
The Use of Leed for the Characterization of Surface Damage from Pulsed Laser Irradiation
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- 22 February 2011, 3
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Refractory Metals Growth on MBE GaAs
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- 22 February 2011, 13
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Electron Spectroscopic Studies of Substoichiometric Tantalum Carbide
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- 22 February 2011, 19
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Cation Solute Segregation to Surfaces of MgO and α-Al2O3
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- 22 February 2011, 27
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Properties of Single-Crystal Silicon Films on Amorphous SiO2 on Single-Crystal Cubic Zirconia Substrates
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- 22 February 2011, 37
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Atomic Interactions in Silicon-Metal Complexes on W(110)
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- 22 February 2011, 47
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The Thickness Effect on the Microstructure of Sputtered Films Studied by a New X-Ray Diffraction Method
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- 22 February 2011, 55
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Surface Electronic Function Properties Characterization from Defect Heterogeneity Dominated Specular/Glancing/Grazing Versus Bulk Transmission Small-Angle-Scattering(SAS) Diffraction-Pattern via the Static Synergetics Algorithm/Exprimental Model
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- 22 February 2011, 63
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Core-Level Electron Binding Energy Change of Evaporated Pd
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- 22 February 2011, 71
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Depth of Penetration of the Plasma Fluorination Reaction into Various Polymers
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- 22 February 2011, 79
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Surface Composition of Carburized Tungsten Trioxide and its Catalytic Activity
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- 22 February 2011, 85
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Instantaneous Impedance of Aluminium in Anodic Polarization Status
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- 22 February 2011, 91
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Progress and Prospects of Materials Characterization at Subnanometer Spatial Resolution using Finely Focussed Electron Beams
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- 22 February 2011, 107
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Transmission Electron Microscope Investigation of Sputtered Co-Pt Thin Films
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- 22 February 2011, 117
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Characterization of the Ni/NiO, Interface Region in Oxidized High Purity Nickel by Transmission Electron Microscopy
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- 22 February 2011, 127
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Interface Study of Mo/GaAs
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- 22 February 2011, 137
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Determination of the Composition and Thickness of Thin Potassium Polyphosphide Films
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- 22 February 2011, 145
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Defects in Platinum Silicide Formation
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- 22 February 2011, 159
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Auger Electron Analysis of Oxides Grown on a Dilute Zirconium/Nickel Alloy
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- 22 February 2011, 169
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Auger Sputter Depth Profiling Applied to Advanced Semiconductor Device Structures
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- 22 February 2011, 179
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