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Atomic Interactions in Silicon-Metal Complexes on W(110)

Published online by Cambridge University Press:  22 February 2011

John D. Wrigley  and
Gert Ehrlich
John D. Wrigley
Affiliation:
Coordinated Science Laboratory, Uníversity of Illinois, Urbana, IL 61801
Gert Ehrlich
Affiliation:
Coordinated Science Laboratory, Uníversity of Illinois, Urbana, IL 61801
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Abstract

With the field-ion microscope one not only can locate individual atoms at a surface, but under some circumstances also can discriminate between chemically different species. These capabilities are illustrated in an examination of the strength of binding in silicon-metal surface clusters and in a detailed analysis of their mobility.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 48: Symposium E – Applied Materials Characterization , 1985 , 47
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

1. See, for example, Ho, P. S. and Tu, K. N. (eds.),Thin Films and Interfaces, North-Holland, New York, 1982; also J. Vac. Sci. Technol. B2 (1984) 693–784.Google Scholar
2. The technique has been reviewed recently by Panitz, J. A., J. Phys E, 15 (1982) 1281.Google Scholar
3. Studies on metal clusters are reviewed by Bassett, D. W., in Binh, V. T. (ed.), Surface Mobilities on Solid Materials, Plenum, New York, 1983 p. 83.CrossRefGoogle Scholar
4. For recent observations, see Fink, H.-W. and Ehrlich, G., J. Chem. Phys, 81 (1984) 4657.Google Scholar
5. Stolt, K., Graham, W. R., and Ehrlich, G., J. Chem. Phys., 65 (1976) 3206.Google Scholar
6. Wrigley, J. D. and Ehrlich, G., to be published.Google Scholar