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In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression - ERRATUM

Published online by Cambridge University Press:  23 March 2020

Owen Brazil ,
Johann P. de Silva ,
Mithun Chowdhury ,
Heedong Yoon ,
Gregory B. McKenna ,
Warren C. Oliver ,
Jason Kilpatrick ,
John B. Pethica  and
Graham L.W. Cross
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Abstract

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Type
Erratum
Information
Journal of Materials Research , Volume 35 , Issue 6 , 30 March 2020 , pp. 654
Copyright
Copyright © Materials Research Society 2020

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References

Brazil, O., de Silva, J.P., Chowdhury, M., Yoon, H., McKenna, G.B., Oliver, W.C., Kilpatrick, J., Pethica, J.B., and Cross, G.L.W.: In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression. J. Mater. Res. (2020).Google Scholar