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Transient grating spectroscopy: An ultrarapid, nondestructive materials evaluation technique

Published online by Cambridge University Press:  09 May 2019

Felix Hofmann
Affiliation:
Department of Engineering Science, University of Oxford, UK; [email protected]
Michael P. Short
Affiliation:
Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, USA; [email protected]
Cody A. Dennett
Affiliation:
Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, USA; [email protected]
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Abstract

Structure–property relationships are the foundation of materials science and are essential for predicting material response to driving forces, managing in-service material degradation, and engineering materials for optimal performance. Elastic, thermal, and acoustic properties provide a convenient gateway to directly or indirectly probe materials structure across multiple length scales. This article will review how using the laser-induced transient grating spectroscopy (TGS) technique, which uses a transient diffraction grating to generate surface acoustic waves and temperature gratings on a material surface, nondestructively reveals the material’s elasticity, thermal diffusivity, and energy dissipation on the sub-microsecond time scale, within a tunable subsurface depth. This technique has already been applied to many challenging problems in materials characterization, from analysis of radiation damage, to colloidal crystals, to phonon-mediated thermal transport in nanostructured systems, to crystal orientation and lattice parameter determination. Examples of these applications, as well as inferring aspects of microstructural evolution, illustrate the wide potential reach of TGS to solve old materials challenges and to uncover new science. We conclude by looking ahead at the tremendous potential of TGS for materials discovery and optimization when applied in situ to dynamically evolving systems.

Type
Acoustic Processes in Materials
Copyright
Copyright © Materials Research Society 2019 

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References

Tanenbaum, M., Mills, A.D., J. Electrochem. Soc. 108, 171 (1961).CrossRefGoogle Scholar
Jonas, J.J., Sellars, C.M., Tegart, W.J.M., Metall. Rev. 14, 1 (1969).Google Scholar
Ishihara, T., Matsuda, H., Takita, Y., J. Am. Chem. Soc. 116, 3801 (1994).CrossRefGoogle Scholar
Harris, A.M., Lee, E.C., J. Appl. Polym. Sci. 107, 2246 (2008).CrossRefGoogle Scholar
Li, Y.J., Savan, A., Kostka, A., Stein, H.S., Ludwig, A., Mater. Horiz. 5, 86 (2018).CrossRefGoogle Scholar
Curtarolo, S., Hart, G.L.W., Nardelli, M.B., Mingo, N., Sanvito, S., Levy, O., Nat. Mater. 12, 191 (2013).CrossRefGoogle Scholar
Hosemann, P., Scr. Mater. 143, 161 (2018).CrossRefGoogle Scholar
Bei, H., Shim, S., George, E.P., Miller, M.K., Herbert, E.G., Pharr, G.M., Scr. Mater. 57, 397 (2007).CrossRefGoogle Scholar
De Jonge, N., Ross, F.M., Nat. Nanotechnol. 6, 695 (2011).CrossRefGoogle Scholar
Hofmann, F., Tarleton, E., Harder, R.J., Phillips, N.W., Ma, P.-W.W., Clark, J.N., Robinson, I.K., Abbey, B., Liu, W., Beck, C.E., Sci. Rep. 7, 45993 (2017).CrossRefGoogle Scholar
Donnelly, C., Guizar-Sicairos, M., Scagnoli, V., Gliga, S., Holler, M., Raabe, J., Heyderman, L.J., Nature 547, 328 (2017).CrossRefGoogle Scholar
Ulvestad, A., Singer, A., Clark, J.N., Cho, H.M., Kim, J.W., Harder, R., Maser, J., Meng, Y.S., Shpyrko, O.G., Science 348, 1344 (2015).CrossRefGoogle Scholar
Wright, R.N., Sham, T.-L., “Status of Metallic Structural Materials for Molten Salt Reactors” (2018), doi:INL/EXT-18–45171.Google Scholar
Corwin, W.R., Lucas, G.E., in ASTM Symposium on the Use of Nonstandard Subsized Specimens for Irradiated Testing (ASTM, Philadelphia, PA, 1986), p. 379, https://inis.iaea.org/search/search.aspx?orig_q=RN:18065732.Google Scholar
Tanguy, B., Besson, J., Piques, R., Pineau, A., Eng. Fract. Mech. 72, 49 (2005).CrossRefGoogle Scholar
Server, W.L., Nanstad, R.K., Odette, G.R., “Use of Reactor Pressure Vessel Surveillance Materials for Extended Life Evaluations Using Power and Test Reactor Irradiations” (2012), https://inis.iaea.org/collection/NCLCollectionStore/_Public/43/070/43070853.pdf.Google Scholar
Onizawa, K., Fukaya, K., Nishiyama, Y., Suzuki, M., Kaihara, S., Nakamura, T., Int. J. Press. Vessels Pip. 70, 201 (1997).CrossRefGoogle Scholar
Getto, E., Sun, K., Monterrosa, A.M., Jiao, Z., Hackett, M.J., Was, G.S., J. Nucl. Mater. 480, 159 (2016).CrossRefGoogle Scholar
Garner, F.A., Toloczko, M.B., J. Nucl. Mater. 251, 252 (1997).CrossRefGoogle Scholar
Wang, Y., Yousefzadeh, B., Chen, H., Nassar, H., Huang, G., Daraio, C., Phys. Rev. Lett. 121, 194301 (2018).CrossRefGoogle Scholar
Cha, J., Daraio, C., Nat. Nanotechnol. 13, 1016 (2018).CrossRefGoogle Scholar
Dyre, J.C., Rev. Mod. Phys. 78, 953 (2006).CrossRefGoogle Scholar
Tanaka, H., Kawasaki, T., Shintani, H., Watanabe, K., Nat. Mater. 9, 324 (2010).CrossRefGoogle Scholar
Boechler, N., Theocharis, G., Daraio, C., Nat. Mater. 10, 665 (2011).CrossRefGoogle Scholar
Nesterenko, V.F., Dynamics of Heterogeneous Materials (Springer, New York, 2001).CrossRefGoogle Scholar
Minnich, A.J., Dresselhaus, M.S., Ren, Z.F., Chen, G., Energy Environ. Sci. 2, 466 (2009).CrossRefGoogle Scholar
Ryder, M.R., Civalleri, B., Tan, J.C., Phys. Chem. Chem. Phys. 18, 9079 (2016).CrossRefGoogle Scholar
Tan, J.C., Civalleri, B., Lin, C.C., Valenzano, L., Galvelis, R., Chen, P.F., Bennett, T.D., Mellot-Draznieks, C., Zicovich-Wilson, C.M., Cheetham, A.K., Phys. Rev. Lett. 108, 095502 (2012).CrossRefGoogle Scholar
Ryder, M.R., Civalleri, B., Cinque, G., Tan, J.C., CrystEngComm 18, 4303 (2016).CrossRefGoogle Scholar
Maznev, A.A., Mazurenko, A., Zhuoyun, L., Gostein, M., Rev. Sci. Instrum. 74, 667 (2003).CrossRefGoogle Scholar
Maznev, A.A., Nelson, K.A., Rogers, J.A., Opt. Lett. 23, 1319 (1998).CrossRefGoogle Scholar
Johnson, J.A., Maznev, A.A., Bulsara, M.T., Fitzgerald, E.A., Harman, T.C., Calawa, S., Vinels, C.J., Turner, G., Nelson, K.A., J. Appl. Phys. 111, 023503 (2012).CrossRefGoogle Scholar
Nelson, K.A., Casalegno, R., Miller, R.J.D., Fayer, M.D., J. Chem. Phys. 77, 1144 (1982).CrossRefGoogle Scholar
Dennett, C.A., Short, M.P., Appl. Phys. Lett. 110, 211106 (2017).CrossRefGoogle Scholar
Hofmann, F., Mason, D.R., Eliason, J.K., Maznev, A.A., Nelson, K.A., Dudarev, S.L., Sci. Rep. 5, 16042 (2015).CrossRefGoogle Scholar
Peter, G.M., Nanotechnology 16, 995 (2005).Google Scholar
Every, A.G., Kim, K.Y., Maznev, A.A., J. Acoust. Soc. Am. 102, 1346 (1997).CrossRefGoogle Scholar
Favretto-Cristini, N., Komatitsch, D., Carcione, J.M., Cavallini, F., Ultrasonics 51, 653 (2011).CrossRefGoogle Scholar
Du, X., Zhao, J.C., npj Comput. Mater. 3 (2017), doi:10.1038/s41524–017–0019-x.CrossRefGoogle Scholar
Every, A.G., Maznev, A.A., Grill, W., Pluta, M., Comins, J.D., Wright, O.B., Matsuda, O., Sachse, W., Wolfe, J.P., Wave Motion 50, 1197 (2013).CrossRefGoogle Scholar
Brown, J.M., Ultrasonics 90, 23 (2018).CrossRefGoogle Scholar
Käding, O.W., Skurk, H., Maznev, A.A., Matthias, E., Appl. Phys. A 61, 253 (1995).CrossRefGoogle Scholar
Dennett, C.A., Short, M.P., J. Appl. Phys. 123, 215109 (2018).CrossRefGoogle Scholar
Royer, D., Dieulesaint, E., J. Acoust. Soc. Am. 76, 1438 (1984).CrossRefGoogle Scholar
Goossens, J., Leclaire, P., Xu, X., Glorieux, C., Martinez, L., Sola, A., Siligardi, C., Cannillo, V., Van der Donck, T., Celis, J.-P., J. Appl. Phys. 102, 053508 (2007).CrossRefGoogle Scholar
Rogers, J.A., Fuchs, M., Banet, M.J., Hanselman, J.B., Logan, R., Nelson, K.A., Appl. Phys. Lett. 71, 225 (1997).CrossRefGoogle Scholar
Vega-Flick, A., Eliason, J.K., Maznev, A.A., Khanolkar, A., Abi Ghanem, M., Boechler, N., Alvarado-Gil, J.J., Nelson, K.A., Rev. Sci. Instrum. 86 (2015), doi:10.1063/1.4936767.CrossRefGoogle Scholar
Dennett, C.A., Cao, P., Ferry, S.E., Vega-Flick, A., Maznev, A.A., Nelson, K.A., Every, A.G., Short, M.P., Phys. Rev. B 94, 214106 (2016).CrossRefGoogle Scholar
Dienes, G.J., Phys. Rev. 86, 228 (1952).CrossRefGoogle Scholar
Folweiler, R.G., Brotzen, F.R., Acta Metall . 7, 716 (1959).CrossRefGoogle Scholar
Dieckamp, H., Sosin, A., J. Appl. Phys. 27, 1416 (1956).CrossRefGoogle Scholar
Du, X., Zhao, J.C., Scr. Mater. 152, 24 (2018).CrossRefGoogle Scholar
Gasteau, D., Chigarev, N., Ducousso-Ganjehi, L., Gusev, V.E., Jenson, F., Calmon, P., Tournat, V., J. Appl. Phys. 119, 43103 (2016).CrossRefGoogle Scholar
Xu, Y., Aizawa, T., Kihara, J., Mater. Trans. JIM 38, 536 (1997).CrossRefGoogle Scholar
Li, D.Y., Szpunar, J.A., Acta Metall. Mater. 40, 3277 (1992).CrossRefGoogle Scholar
Hofmann, F., Nguyen-Manh, D., Gilbert, M.R., Beck, C.E., Eliason, J.K., Maznev, A.A., Liu, W., Armstrong, D.E.J., Nelson, K.A., Dudarev, S.L., Acta Mater . 89, 352 (2015).CrossRefGoogle Scholar
Rieth, M., Dudarev, S.L., Gonzalez de Vicente, S.M., Aktaa, J., Ahlgren, T., Antusch, S., Armstrong, D.E.J., Balden, M., Baluc, N., Barthe, M.-F., Basuki, W.W., Battabyal, M., Becquart, C.S.. Blagoeva, D., Boldyryeva, H., Brinkmann, J., Celino, M., Ciupinski, L., Correia, J.B., De Backer, A., Domain, C., Gaganidze, E., García-Rosales, C., Gibson, J., Gilbert, M.R., Giusepponi, S., Gludovatz, B., Greuner, H., Heinola, K., Höschen, T., Hoffmann, A., Holstein, N., Koch, F., Krauss, W., Li, H., Lindig, S., Linke, J., Linsmeier, Ch., López-Ruiz, P., Maier, H., Matejicek, J., Mishra, T.P., Muhammed, M., Muñoz, A., Muzyk, M., Nordlund, K., Nguyen-Manh, D., Opschoor, J., Ordás, N., Palacios, T., Pintsuk, G., Pippan, R., Reiser, J., Riesch, J., Roberts, S.G., Romaner, L., Rosiński, M., Sanchez, M., Schulmeyer, W., Traxler, H., Ureña, A., van der Laan, J.G., Veleva, L., Wahlberg, S., Walter, M., Weber, T., Weitkamp, T., Wurster, S., Yar, M.A., You, J.H., Zivelonghi, A., J. Nucl. Mater. 432, 482 (2013).CrossRefGoogle Scholar
Zhou, Z., Dudarev, S.L., Jenkins, M.L., Sutton, A.P., Kirk, M.A., J. Nucl. Mater. 367, P, 305 (2007).CrossRefGoogle Scholar
Armstrong, D.E.J., Edmondson, P.D., Roberts, S.G., Appl. Phys. Lett. 102, 1 (2013).CrossRefGoogle Scholar
Duncan, R.A., Hofmann, F., Vega-Flick, A., Eliason, J.K., Maznev, A.A., Every, A.G., Nelson, K.A., Appl. Phys. Lett. 109, 151906 (2016).CrossRefGoogle Scholar
Dennett, C.A., So, K.P., Kushima, A., Buller, D.L., Hattar, K., Short, M.P., Acta Mater . 145, 496 (2018).CrossRefGoogle Scholar
Dennett, C.A., Buller, D.L., Hattar, K., Short, M.P., Nucl. Instrum. Methods Phys. Res. B 440, 126 (2019).CrossRefGoogle Scholar
Friedel, J., London, Edinburgh Dublin Philos. Mag. J. Sci. 44, 444 (1953).CrossRefGoogle Scholar
Parkin, D., Goldstone, J., Simpson, H., Hemsky, J., J. Phys. F Met. Phys. 17, 577 (1987).CrossRefGoogle Scholar
Li, N., Hattar, K., Misra, A., J. Nucl. Mater. 439, 185 (2013).CrossRefGoogle Scholar
Boechler, N., Eliason, J.K., Kumar, A., Maznev, A.A., Nelson, K.A., Fang, N., Phys. Rev. Lett. 111, 036103 (2013).CrossRefGoogle Scholar
Otsuka, P.H., Mezil, S., Matsuda, O., Tomoda, M., Maznev, A.A., Gan, T., Fang, N., Boechler, N., Gusev, V.E., Wright, O.B., New J. Phys. 20, 013026 (2018).CrossRefGoogle Scholar
Hiraiwa, M., Abi Ghanem, M., Wallen, S.P., Khanolkar, A., Maznev, A.A., Boechler, N., Phys. Rev. Lett. 116, 198001 (2016).CrossRefGoogle Scholar
Eliason, J.K., Vega-Flick, A., Hiraiwa, M., Khanolkar, A., Gan, T., Boechler, N., Fang, N., Nelson, K.A., Maznev, A.A., Appl. Phys. Lett. 108, 061907 (2016).CrossRefGoogle Scholar
Norajitra, P., Giniyatulin, R., Hirai, T., Krauss, W., Kuznetsov, V., Mazul, I., Ovchinnikov, I., Reiser, J., Ritz, G., Ritzhaupt-Kleissl, H.J., Widak, V., Fusion Eng. Des. 84, 1429 (2009).CrossRefGoogle Scholar
Norajitra, P., Antusch, S., Giniyatulin, R., Kuznetsov, V., Mazul, I., Ritzhaupt-Kleissl, H.J., Spatafora, L., Fusion Eng. Des. 86, 1656 (2011).CrossRefGoogle Scholar
Ziman, J.M., Electrons and Phonons: The Theory of Transport Phenomena in Solids (Oxford University Press, Oxford, UK, 2001).CrossRefGoogle Scholar
Cahill, D.G., Ford, W.K., Goodson, K.E., Mahan, G.D., Majumdar, A., Maris, H.J., Merlin, R., Phillpot, S.R., J. Appl. Phys. 93, 793 (2003).CrossRefGoogle Scholar
Cahill, D.G., Braun, P.V., Chen, G., Clarke, D.R., Fan, S., Goodson, K.E., Keblinski, P., King, W.P., Mahan, G.D., Majumdar, A., Maris, H.J., Phillpot, S.R., Pop, E., Shi, L., Appl. Phys. Rev. 1, 011305 (2014).CrossRefGoogle Scholar
Derlet, P.M., Nguyen-Manh, D., Dudarev, S.L., Phys. Rev. B 76, 54107 (2007).CrossRefGoogle Scholar
Nordlund, K., Zinkle, S.J., Sand, A.E., Granberg, F., Averback, R.S., Stoller, R.E., Suzudo, T., Malerba, L., Banhart, F., Weber, W.J., Willaime, F., Dudarev, S.L., Simeone, D., J. Nucl. Mater. 512, 450 (2018).CrossRefGoogle Scholar
Sand, A.E., Byggmästar, J., Zitting, A., Nordlund, K., J. Nucl. Mater. 511, 64 (2018).CrossRefGoogle Scholar
Ferry, S.E., “Breaking the Bottleneck in Radiation Materials Science with Transient Grating Spectroscopy,” PhD thesis, Massachusetts Institute of Technology (2018).Google Scholar
Loomis, B.A., Gerber, S.B., Acta Metall . 21, 165 (1973).CrossRefGoogle Scholar
Fujitsuka, M., Tsuchiya, B., Mutoh, I., Tanabe, T., Shikama, T., J. Nucl. Mater. 283, (Pt.2), 1148 (2000).CrossRefGoogle Scholar
Roedig, M., Kuehnlein, W., Linke, J., Pitzer, D., Merola, M., Rigal, E., Schedler, B., Visca, E., J. Nucl. Mater. 329, 766 (2004).CrossRefGoogle Scholar
Peacock, A.T., Barabash, V., Dänner, W., Rödig, M., Lorenzetto, P., Marmy, P., Merola, M., Singh, B.N., Tähtinen, S., van der Laan, J., Wu, C.H., J. Nucl. Mater. 329, 173 (2004).CrossRefGoogle Scholar
Blakemore, J.S., Solid State Physics, 2nd ed. (Cambridge University Press, Cambridge, UK, 1985).CrossRefGoogle Scholar
Johnson, J.A., Maznev, A.A., Cuffe, J., Eliason, J.K., Minnich, A.J., Kehoe, T., Torres, C.M.S., Chen, G., Nelson, K.A., Phys. Rev. Lett. 110, 25901 (2013).CrossRefGoogle Scholar
Huberman, S., Chiloyan, V., Duncan, R.A., Zeng, L., Jia, R., Maznev, A.A., Fitzgerald, E.A., Nelson, K.A., Chen, G., Phys. Rev. Mater. 1, 054601 (2017).CrossRefGoogle Scholar
Johnson, J.A., Eliason, J.K., Maznev, A.A., Luo, T., Nelson, K.A., J. Appl. Phys. 118 (2015), doi:10.1063/1.4933285.Google Scholar