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Herbicide Dispersal Patterns: II. Mapping Residues Using X-ray Fluorescence

Published online by Cambridge University Press:  12 June 2017

F. D. Hess ,
R. H. Falk  and
D. E. Bayer
F. D. Hess
Affiliation:
Bot. Dep., Univ. of Calif., Davis, CA 95616
R. H. Falk
Affiliation:
Bot. Dep., Univ. of Calif., Davis, CA 95616
D. E. Bayer
Affiliation:
Bot. Dep., Univ. of Calif., Davis, CA 95616
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Abstract

Distribution patterns of foliar applied herbicides can be studied by x-ray element mapping provided the herbicide contains an atom with an atomic number of 11 (sodium) or greater. The suitability of an herbicide for element mapping increases as the number of similar detectable atoms per molecule increases. Herbicides containing one detectable atom per molecule provide usable element maps at concentrations of 1.12 kg/ha and higher. Inaccurate element maps can result from: (1) Formulation components containing detectable atoms the same as those of the active ingredient. (2) Herbicide volatility during analysis due to reduced pressures and heating. (3) Specimen topography preventing x-ray detection at some locations on the plant surface. (4) Herbicide concentrations that are below the minimum detectable limit. If adequate precautions are followed in the use of x-ray element mapping, a wide range of uses exist in weed science.

Type
Research Article
Information
Weed Science , Volume 23 , Issue 4 , July 1975 , pp. 308 - 314
Copyright
Copyright © 1975 by the Weed Science Society of America 

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References

Literature Cited

1. Barbi, N.C., Sandborg, A.O., Russ, J.C., and Soderquist, C.E. 1974. Light element analysis on the scanning electron microscope using a windowless energy dispersive x-ray spectrometer. Proc. 7th Annual Scanning Electron Microscopy Symposium. Johari, O. and Corvin, I., eds., IIT Research Institute 7:152–158.Google Scholar
2. Bomback, J.L. 1973. Stereoscopic techniques for improved x-ray analysis of rough SEM specimens. Proc. 6th Annual Scanning Electron Microscopy Symposium. Johari, O. and Corvin, I. eds. IIT Research Institute 6:97–104.Google Scholar
3. Dybing, C.D. and Currier, H.B. 1961. Foliar penetration by chemicals. Plant Physiol. 36:169–174.Google Scholar
4. Falk, R.H., Hess, F.D., and Bayer, D.E. 1975. X-ray fluorescence in weed science. Weed Sci. In press.CrossRefGoogle Scholar
5. Hess, F.D., Falk, R.H., and Bayer, D.E. 1975. The influence of specimen topography on x-ray microanalysis element mapping. Amer. J. Bot. In Press.CrossRefGoogle Scholar
6. Hess, F.D., Bayer, D.E., and Falk, R.H. 1974. Herbicide Dispersal Patterns: I. As a function of leaf surface. Weed Science 22:394–401.Google Scholar
7. Leamy, H.J. and Ferris, S.D. 1972. Scanning x-ray emission microscopy. Proc. 5th Annual Electron Microscopy Symposium. Johari, O. and Corvin, I., eds. IIT Research Institute 5:81–88.Google Scholar
8. Ong, B.Y., Falk, R.H., and Bayer, D.E. 1973. Scanning electron microscope observations of herbicide dispersal using cathodoluminescence as the detection mode. Plant Physiol. 51:415–420.Google Scholar
9. Parr, J.F. and Norman, A.G. 1965. Considerations in the use of surfactants in plant systems: A review. Bot. Gaz. 126:86–96.Google Scholar
10. Speelman, L. 1971. A fluorescent tracer technique for determination of the liquid distribution of field crop sprayers. J. Agric. Engng. Res. 16:301–306.Google Scholar
11. Staniland, L.N. 1959. Fluorescent tracer techniques for the study of spray and dust deposits. J. Agric. Engng. Res. 4:110–125.Google Scholar
12. Sutfin, L.V. and Ogilvie, R.E. 1970. A comparison of x-ray analysis techniques available for scanning electron microscopes. Proc. 3rd Annual Scanning Electron Microscopy Symposium. Johari, O., ed. IIT Research Institute 3:17–24.Google Scholar
13. Yakowitz, H. 1974. X-ray microanalysis in scanning electron microscopy. Proc. 7th Annual Scanning Electron Microscopy Symposium. Johari, O. and Corvin, I., eds., IIT Research Institute 7:1029–1042.Google Scholar
14. Yates, W.E. and Akesson, N.B. 1963. Fluorescent tracers for quantitative microresidue analysis. Trans. Am. Soc. Agric. Engrs. 6:104–114.Google Scholar