In this paper the dependence of
the effective secondary emission coefficient-effective electron yield γeff in nitrogen on the reduced field (the ratio of the electric field
and the gas density E/N) for various cathode surfaces
is determined.
Two different methods are applied:
swarm measurements (from breakdown voltage)
and time delay measurements. In the latter technique, first
the breakdown probability is determined
as a function of voltage and then γeff is derived from it. The results of applying both methods
are in good agreement for the γeffversusE/N dependence.
The measurements were made for copper cathode,
untreated and treated by gas discharge and also
several thousand electrical breakdowns, gold-plated copper
and steel cathodes.
Secondary electron yield γeff is of the order of a few percent
at moderate and high E/N,
and slightly increases
with increasing E/N up to several kTd.
At low E/N, a
characteristic peak appears (at about
600 Td for copper).
The γeff value increases when copper cathode
is treated by gas discharges
and becomes stable after several thousand breakdowns,
agreeing well with other breakdown results in the literature.
The chosen values for the Townsend primary ionization coefficient,
obtained from best fits to available experimental data in the
literature and the choice of the equilibration distance from the cathode
significantly influence determination of γeff.
Finally, our results are compared with the results
of other authors for different cathode materials
and a good agreement is found.